Browsing

Showing results 1 to 4 of 4
PreviewAuthors / EditorsTitleTypeIssue Date
Schanovsky Franz - 2013 - Atomistic modeling in the context of the bias...pdf.jpgSchanovsky, Franz Atomistic modeling in the context of the bias temperature instabilityThesis Hochschulschrift 2013
Pobegen Gregor - 2013 - Degradation of electrical parameters of power...pdf.jpgPobegen, Gregor Degradation of electrical parameters of power semiconductor devices - process influences and modelingThesis Hochschulschrift 2013
Goes Wolfgang - 2011 - Hole trapping and the negative bias temperature...pdf.jpgGös, Wolfgang Hole trapping and the negative bias temperature instabilityThesis Hochschulschrift 2011
Grasser Tibor - 1999 - Mixed-mode device simulation.pdf.jpgGrasser, Tibor Mixed-mode device simulationThesis Hochschulschrift 1999