Browsing by Author Hutter, Herbert

Showing results 1 to 14 of 14
PreviewAuthors / EditorsTitleTypeIssue Date
Application of mid-infrared quantum cascade lasers for quantitative analysis in aqueous phase.pdf.jpgSchaden, Stefan Application of mid-infrared quantum cascade lasers for quantitative analysis in aqueous phaseThesis Hochschulschrift 2006
Application of secondary ion mass spectrometry SIMS in the development of new materials.pdf.jpgRosner, Martin Application of secondary ion mass spectrometry (SIMS) in the development of new materialsThesis Hochschulschrift 2003
Applications of high performance physical analytics in materials science.pdf.jpgKrecar, Dragan Applications of high performance physical analytics in materials scienceThesis Hochschulschrift 2005
Characterization of contaminations on semiconductor surfaces and thin layer systems with Time of Flight - secondary ion mass spectrometry.pdf.jpgPuchner, Stefan Characterization of contaminations on semiconductor surfaces and thin layer systems with Time of Flight - secondary ion mass spectrometryThesis Hochschulschrift 2011
The effect of counterions and solvent on the properties of D spin crossover polymers.pdf.jpgBartel, Matthias The effect of counterions and solvent on the properties of 3D spin crossover polymersThesis Hochschulschrift 2007
Experimental Design for Voltage Driven Tracer Incorporation and Diffusion Studies on Oxide Thin Film Electrodes.pdf.jpgHuber, Tobias M.; Navickas, Edvinas; Sasaki, Kazunari; Yildiz, Bilge; Tuller, Harry; Friedbacher, Gernot ; Hutter, Herbert; Fleig, JuergenExperimental Design for Voltage Driven Tracer Incorporation and Diffusion Studies on Oxide Thin Film ElectrodesArticle Artikel 2017
Image-based chemical structure determination.pdf.jpgOfner, Johannes ; Brenner, Florian ; Wieland, Karin; Eitenberger, Elisabeth ; Kirschner, Johannes ; Eisenmenger-Sittner, Christoph; Török, Szilvia; Döme, Balazs; Konegger, Thomas ; Kasper-Giebl, Anne ; Hutter, Herbert; Friedbacher, Gernot; Lendl, Bernhard  ; Lohninger, Hans Image-based chemical structure determinationArticle Artikel 2017
The interaction of Bi cluster ions with ionic liquids.pdf.jpgHolzweber, MarkusThe interaction of Bi cluster ions with ionic liquidsThesis Hochschulschrift 2011
Investigations of mobile ion transport processes in thin layers upon bias-temperature stress.pdf.jpgKrivec, Stefan Investigations of mobile ion transport processes in thin layers upon bias-temperature stressThesis Hochschulschrift 2011
Kovalent verbundene Typ II Photoinitiatoren fuer die radikalische Photopolymerisation.pdf.jpgJauk, Sigrid Kovalent verbundene Typ II Photoinitiatoren für die radikalische PhotopolymerisationThesis Hochschulschrift 2008
Metal assisted photochemical etching of H silicon carbide.pdf.jpgLeitgeb, Markus ; Zellner, Christopher ; Schneider, Michael ; Schwab, Stefan ; Hutter, Herbert; Schmid, UlrichMetal assisted photochemical etching of 4H silicon carbideArticle Artikel 2017
Novel applications of secondary ion mass spectrometry in thin film analysis.pdf.jpgMayerhofer, Karl Emanuel Novel applications of secondary ion mass spectrometry in thin film analysisThesis Hochschulschrift 2006
Spectral characterisation of different glycerophospholipids using time-of-flight secondary ion mass spectrometry and matrix-assisted laser desorptionionisation time-of-flight mass spectrometry.pdf.jpgHefele, Roman Markus Spectral characterisation of different glycerophospholipids using time-of-flight secondary ion mass spectrometry and matrix-assisted laser desorption/ionisation time-of-flight mass spectrometryThesis Hochschulschrift 2010
TOF-SIMS investigations of metal impurities in silicon.pdf.jpgWidder, Lukas TOF-SIMS investigations of metal impurities in siliconThesis Hochschulschrift 2008