2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

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ISBN

9798350332520

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		Preview	Author(s)	Title	Type	Issue Date
	1		Grill, Alexander ; Michl, J. ; Díaz-Fortuny, Javier ; Beckers, Arnout ; Bury, Erik ; Chasin, Adrian ; Grasser, Tibor ; Waltl, Michael ; Kaczer, Ben ; De Greve, Kristiaan	A Comprehensive Cryogenic CMOS Variability and Reliability Assessment using Transistor Arrays	Inproceedings Konferenzbeitrag	2023