MC 2025 Karlsruhe : Microscopy Conference : Proceedings

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978-3-948023-55-3

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		Preview	Author(s)	Title	Type	Issue Date
	1		Beltrán Romero, S. S. ; Gaida, M ; Löffler, S. ; Nimmrichter, S. ; Rätzel, D. ; Haslinger, P.	Optimizing spin detection in TEM – From imaging to quantum metrology	Inproceedings Konferenzbeitrag	Aug-2025