2025 IEEE International Reliability Physics Symposium (IRPS)

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Book details Buch-Details

Book title Buchtitel
2025 IEEE International Reliability Physics Symposium (IRPS)
 
ISBN
979-8-3315-0477-9
 
Publisher Verlag
IEEE
 

Publications Publikationen

Results 1-4 of 4 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Stampfl, Felix Johann ; Godfrin, C. ; Kubicek, S. ; Baudot, S. ; Raes, B. ; De Greve, K. ; Grill, A. ; Waltl, Michael CV Characterization of Si/SiGe Heterostructures at Cryo TemperaturesInproceedings Konferenzbeitrag 15-May-2025
2Ceric, Hajdin Electromigration in Gold: Challenges and Possibilities (Invited)Inproceedings Konferenzbeitrag 15-May-2025
3Ruch, Bernhard ; Chaudhuri, Rajarshi Roy ; Butej, Boris ; Gomes, Joao ; Stabentheiner, Manuel ; Reiser, Korbinian ; Koller, Christian ; Pogany, Dionyz ; Ostermaier, Clemens ; Waltl, Michael Evidence for 2D Hole Gas in GaN Gate Injection Transistors and its Role in RDson RecoveryInproceedings Konferenzbeitrag 15-May-2025
4Marcuzzi, A. ; Avramenko, M. ; De Santi, C. ; Moens, P. ; Gomez Garcia, G.J. ; Feng, Ang ; Grasser, Tibor ; Meneghesso, G. ; Zanoni, E. ; Meneghini, M. Recombination-Driven Interface Trap Generation in SiC MOSFETs Under Constant Voltage and Constant Current StressInproceedings Konferenzbeitrag 15-May-2025