2009 IEEE International Symposium on Industrial Embedded Systems

Book title Buchtitel
2009 IEEE International Symposium on Industrial Embedded Systems
 
Publisher Herausgeber
IEEE
 

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Author:  Paulitsch, H.

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1Paulitsch, H. ; Paukovits, C. ; El Salloum, C. Fault isolation with intermediate checks of end-to-end checksums in the Time-Triggered System-on-Chip ArchitectureKonferenzbeitrag Inproceedings 2009