Proceedings of The Second International Conference on Advances in System Testing and Validation Lifecycle

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Proceedings of The Second International Conference on Advances in System Testing and Validation Lifecycle
 
Publisher Herausgeber
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Author:  Oetsch, Johannes

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PreviewAuthor(s)TitleTypeIssue Date
1Erdem, Esra ; Inoue, Katsumi ; Oetsch, Johannes ; Puehrer, Joerg ; Tompits, Hans ; Yilmaz, Cemal Answer-Set Programming as a new Approach to Event-Sequence TestingKonferenzbeitrag Inproceedings 2011