2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)

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Subject: Ontology

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		Preview	Author(s)	Title	Type	Issue Date
	1		Steinegger, Michael ; Melik-Merkumians, Martin ; Zajc, Johannes ; Schitter, Georg	A framework for automatic knowledge-based fault detection in industrial conveyor systems	Konferenzbeitrag Inproceedings	2017
	2		Steinegger, Michael ; Melik-Merkumians, Martin ; Schitter, Georg	Ontology-based framework for the generation of interlock code with redundancy elimination	Konferenzbeitrag Inproceedings	2017