2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)

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Publisher Herausgeber

IEEE

Place of publishing Erscheinungsort

Germany

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Author: Chaturvedi, Vivek

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		Preview	Author(s)	Title	Type	Issue Date
	1		Rathore, Vijeta ; Chaturvedi, Vivek ; Singh, Amit K. ; Srikanthan, Thambipillai ; R., Rohith ; Lam, Siew-Kei ; Shafique, Muhammad	HiMap: A hierarchical mapping approach for enhancing lifetime reliability of dark silicon manycore systems	Konferenzbeitrag Inproceedings	2018

2018 Design, Automation &amp; Test in Europe Conference &amp; Exhibition (DATE)