2005 International Conference On Simulation of Semiconductor Processes and Devices

View Statistics Email Alert RSS Feed

Book details Buch-Details

Book title Buchtitel
2005 International Conference On Simulation of Semiconductor Processes and Devices
 
Publisher Herausgeber
IEEE
 

Publications Publikationen

Filter:
Author:  Kosina, Hans

Results 1-5 of 5 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Ungersboeck, E. ; Kosina, H. The Effect of Degeneracy on Electron Transport in Strained Silicon Inversion LayersKonferenzbeitrag Inproceedings2005
2Karner, M. ; Gehring, A. ; Kosina, H. ; Selberherr, S. Efficient Calculation of Quasi-Bound State Tunneling in CMOS DevicesKonferenzbeitrag Inproceedings2005
3Pourfath, M. ; Kosina, H. ; Cheong, B.H. ; Park, W.J. Geometry-dependence of the DC and AC Response of Ohmic Contact Carbon Nanotube Field Effect TransistorsKonferenzbeitrag Inproceedings2005
4Entner, Robert ; Gehring, Andreas ; Kosina, Hans ; Grasser, Tibor ; Selberherr, Siegfried Modeling of Tunneling Currents for Highly Degraded CMOS DevicesKonferenzbeitrag Inproceedings2005
5Dhar, S. ; Karlowatz, G. ; Ungersboeck, E. ; Kosina, H. Numerical and Analytical Modeling of the High-Field Electron Mobility in Strained SiliconKonferenzbeitrag Inproceedings2005