2005 International Conference On Simulation of Semiconductor Processes and Devices

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Publisher Herausgeber

IEEE

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Author: Ungersboeck, E.

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		Preview	Author(s)	Title	Type	Issue Date
	1		Ungersboeck, E. ; Kosina, H.	The Effect of Degeneracy on Electron Transport in Strained Silicon Inversion Layers	Konferenzbeitrag Inproceedings	2005
	2		Dhar, S. ; Karlowatz, G. ; Ungersboeck, E. ; Kosina, H.	Numerical and Analytical Modeling of the High-Field Electron Mobility in Strained Silicon	Konferenzbeitrag Inproceedings	2005