2016 46th European Solid-State Device Research Conference (ESSDERC)

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Author: Franco, Jacopo

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		Preview	Author(s)	Title	Type	Issue Date
	1		Sharma, Prateek ; Tyaginov, Stanislav ; Rauch, Stewart E. ; Franco, Jacopo ; Kaczer, Ben ; Makarov, Alexander ; Vexler, Mikhail I. ; Grasser, Tibor	A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer nMOSFETs	Konferenzbeitrag Inproceedings	2016