2016 IEEE International Electron Devices Meeting (IEDM)

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Author: Rzepa, Gerhard

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		Preview	Author(s)	Title	Type	Issue Date
	1		Karner, M ; Baumgartner, Oskar ; Stanojevic, Zlatan ; Schanovsky, Franz ; Strof, G ; Kernstock, Christian ; Karner, H.W. ; Rzepa, Gerhard ; Grasser, Tibor	Vertically stacked nanowire MOSFETs for sub-10nm nodes: Advanced topography, device, variability, and reliability simulations	Konferenzbeitrag Inproceedings	2016