2016 IEEE International Electron Devices Meeting (IEDM)

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Author: Aichinger, Thomas

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		Preview	Author(s)	Title	Type	Issue Date
	1		Rescher, Gerald ; Pobegen, Gregor ; Aichinger, Thomas ; Grasser, Tibor	On the subthreshold drain current sweep hysteresis of 4H-SiC nMOSFETs	Konferenzbeitrag Inproceedings	2016