24th International Conference on Secondary Ion Mass Spectrometry (SIMS-24)

Event name
24th International Conference on Secondary Ion Mass Spectrometry (SIMS-24)
 
Event type
Event for scientific audience
 
Start date
08-09-2024
End date
13-09-2024
 
Location
La Rochelle
Country
France
 
Organizing institution Veranstaltende Institution
Société Française du Vide (SFV)
Event format Veranstaltungsformat
On Site

Publications Publikationen

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PreviewAuthor(s)TitleTypeIssue Date
1Fahrnberger, Florian ; Siebenhofer, Matthäus ; Hahn, Michael ; Sauer, M. ; Foelske, Annette ; Friedbacher, Gernot ; Kubicek, Markus ; Hutter, H. Investigation of sub-nm binary oxidic surface modifications on mixed ionic electronic conductors with ToF-SIMS: Oxidic overlayer stability and ionic interdiffusion behaviorInproceedings Konferenzbeitrag8-Sep-2024