16th ASEM Workshop on Advanced Electron Microscopy (ASEM 2026)

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Description

Event name
16th ASEM Workshop on Advanced Electron Microscopy (ASEM 2026)
 
Event type
Event for scientific audience
 
Start date
20-04-2026
End date
21-04-2026
 
Location
Klosterneuburg
Country
Austria
 
Conference Track
Single Track
Event format Veranstaltungsformat
On Site

Publications Publikationen

Results 1-11 of 11 (Search time: 0.004 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Schachinger-2026-Electron microscopy and trams Towards a friendly coexist...-vor.pdf.jpgSchachinger, Thomas ; Bette, Ulrich ; Brückl, Thomas ; Mallits, Thomas ; Manz, Stephanie ; Randacher, Andreas ; Emmer, Wolfgang ; Schmautzer, Ernst ; Tiran, Karl ; Mörk-Mörkenstein, Rudolf Electron microscopy and trams: Towards a friendly coexistenceInproceedings Konferenzbeitrag 20-Apr-2026
2Nimmrichter-2026-Electron-Enabled Nanoparticle Diffraction-vor.pdf.jpgNimmrichter, Stefan ; Rätzel, Dennis ; Bicket, Isobel C. ; Seifner, Michael S. ; Haslinger, Philipp Electron-Enabled Nanoparticle DiffractionInproceedings Konferenzbeitrag 20-Apr-2026
3Bogdanov, Sergei ; Preimesberger, Alexander ; Hornof, Dominik ; Spielauer, Thomas ; Schachinger, Thomas ; Seifner, Michael Stanislaus ; Bicket, Isobel Claire ; Haslinger, Philipp Ghost Imaging with Free Electron-Photon PairsPresentation Vortrag20-Apr-2026
4Jaroš, Antonín ; Seifner, Michael S. ; Toyfl, Johann ; Czasch, Benjamin ; Beltran-Romero, Santiago ; Bicket, Isobel C. ; Haslinger, Philipp Localized Detection of Electron Spin Precession with Free ElectronsPresentation Vortrag20-Apr-2026
5Stoeger-Pollach-2026-Mapping optical properties of distinct dislocations ...-vor.pdf.jpgStöger-Pollach, Michael ; Scales, Ze Mapping optical properties of distinct dislocations in GaN based electronic devicesInproceedings Konferenzbeitrag 20-Apr-2026
6Beltran-Romero-2026-Metrological Optimization and Simulation of Spin Reso...-vor.pdf.jpgBeltrán-Romero, S. ; Gaida, M. ; Löffler, Stefan ; Nimmrichter, Stefan ; Rätzel, Dennis ; Haslinger, P. Metrological Optimization and Simulation of Spin Resonance Spectroscopy in Transmission Electron MicroscopyInproceedings Konferenzbeitrag 20-Apr-2026
7Preimesberger-2026-Probing Quantum Correlations in Joint Electron-Photon ...-vor.pdf.jpgPreimesberger, Alexander ; Bogdanov, Sergei ; Bicket, Isobel C. ; Rembold, Phila ; Haslinger, Philipp Probing Quantum Correlations in Joint Electron-Photon StatesInproceedings Konferenzbeitrag 20-Apr-2026
8Hornof-2026-Towards Integrating a Trapped-Ion Quantum-Bit in a Transmissi...-vor.pdf.jpgHornof, D. ; Zanetti, M. ; Jungwirth, N. ; Seifner, M. S. ; Schindler, P. ; Juffmann, T. ; Haslinger, P. Towards Integrating a Trapped-Ion Quantum-Bit in a Transmission Electron MicroscopeInproceedings Konferenzbeitrag 20-Apr-2026
9Pescoller, Elias Lukas ; Beltrán Romero, Santiago ; Egginger, Sebastian ; Hornof, Dominik ; Jungwirth, Nicolas ; Zanetti, Martino ; Seifner, Michael S. ; Březinová, Iva ; Haslinger, Philipp ; Juffmann, Thomas ; Kofler, Johannes ; Rätzel, Dennis ; Schindler, Philipp Towards Quantum Computing Enhanced Electron MicroscopyPresentation Vortrag20-Apr-2026
10Zanetti-2026-Towards Ultra-High Vacuum Operation in a TEM for Quantum-Com...-vor.pdf.jpgZanetti, Martino ; Hornof, Dominik ; Seifner, Michael S. ; Haslinger, Philipp ; Juffmann, Thomas Towards Ultra-High Vacuum Operation in a TEM for Quantum-Computer-Enhanced Electron MicroscopyInproceedings Konferenzbeitrag 20-Apr-2026
11Schwarz-2026-Transmission Electron Microscopy of Polymer-Electrolyt-Membr...-vor.pdf.jpgSchwarz, S. ; Binder, M. ; Anker, L. ; Wuketich, D. ; Lauer, T. Transmission Electron Microscopy of Polymer-Electrolyt-MembranesInproceedings Konferenzbeitrag 20-Apr-2026