International Conference on the Physics of Semiconductors

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Description

Event name
International Conference on the Physics of Semiconductors
 
Start date
26-07-2004
End date
30-07-2004
 
Location
Flagstaff, USA
Country
Austria
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

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Author:  Golka, Sebastian

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PreviewAuthor(s)TitleTypeIssue Date
1Brezna, Wolfgang ; Basnar, B. ; Golka, Sebastian ; Enichlmair, H. ; Smoliner, Jürgen Calibrated Scanning Capacitance Microscopy for Two-Dimensional Carrier Mapping of n-type Implants in p-doped Si-WafersKonferenzbeitrag Inproceedings2005