International Conference on Micro- and Nano-Engineering

Event name
International Conference on Micro- and Nano-Engineering
 
Event type
Event for scientific audience
 
Start date
19-09-2005
End date
22-09-2005
 
Location
Wien, Österreich
Country
Austria
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

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Author:  Bertagnolli, Emmerich

Results 1-9 of 9 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Shawrav, Mostafa Moonir ; Taus, Philip ; Wanzenböck, Heinz D. ; Gökdeniz, Z.G. ; Bertagnolli, Emmerich Direct deposition with pure gold nanostructures - Is it possible with FEBID?Konferenzbeitrag Inproceedings2015
2Fischer, Markus ; Wanzenböck, Heinz D. ; Gottsbachner, Josef ; Müller, Stefan ; Brezna, Wolfgang ; Schramböck, Matthias ; Bertagnolli, Emmerich Direct-Write DepostitionUtilization with Focused Ion BeamKonferenzbeitrag Inproceedings2005
3Wanzenböck, Heinz D. ; Shawrav, Mostafa Moonir ; Gavagnin, Marco ; Belic, Domagoj ; Rödinger, Peter ; Hochleitner, Gottfried ; Mika, Johann ; Taus, Philip ; Stöger-Pollach, Michael ; Bertagnolli, Emmerich Focused electron beam induced processing (FEBIP) as maskless 3D direct-write nanolithography platformKonferenzbeitrag Inproceedings2015
44Schöndorfer, Christoph ; Auer, Erwin ; Steinmair, Mathias ; Lugstein, Alois ; Bertagnolli, Emmerich Focused Ion Beam induced Nanodot and Nanowire GrowthPräsentation Presentation2005
45Waid, Simon ; Wanzenböck, Heinz D. ; Mühlberger, Michael ; Bertagnolli, Emmerich Method for 3D Nanoimprint Lithography Stamp FabricationPräsentation Presentation2011
46Wanzenböck, Heinz D. ; Shawrav, Mostafa Moonir ; Gavagnin, Marco ; Wachter, Stefan ; Taus, Philip ; Steiger-Thirsfeld, Andreas ; Stöger-Pollach, Michael ; Persson, Anders ; Gunnarsson, Klas ; Svedlindh, P ; Bertagnolli, Emmerich Nanomagnets as building blocks of logic gates - 3D nano manufacturing of nanomagnet assemblies by electron beam induced depositionKonferenzbeitrag Inproceedings2015
47Abermann, Stephan ; Brezna, Wolfgang ; Smoliner, Jürgen ; Bertagnolli, Emmerich Nanoscopic versus macroscopic C-V characterization of high-k - MOCVD ZrO2 thin filmsPräsentation Presentation2005
48Abermann, Stephan ; Jordan, Christian ; Harasek, Michael ; Bertagnolli, Emmerich Processing and simulation of few nm thick high-k dielectric filmsPräsentation Presentation2005
49Wanzenböck, Heinz D. ; Shawrav, Mostafa Moonir ; Mika, Johann ; Waid, Simon ; Gökdeniz, Z.G. ; Rödinger, Peter ; Bertagnolli, Emmerich Subtractive direct-writing with a focused electron beam - Tailoring monocrystalline semiconductors without carbon contamination by etchingKonferenzbeitrag Inproceedings2015