International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication (EIPBN)

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Description

Event name
International Conference on Electron, Ion and Photon Beam Technology and Nanofabrication (EIPBN)
 
Event type
Event for scientific audience
 
Start date
27-05-2008
End date
30-05-2008
 
Location
Portland, USA
Country
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

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Author:  Wanzenböck, Heinz D.

Results 1-20 of 20 (Search time: 0.003 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Waid, Simon ; Wanzenböck, Heinz D. ; Bertagnolli, Emmerich ; Mühlberger, Michael 3D Nano Patterning using Local Ga Implantation and Subsequent RIE EtchPräsentation Presentation2011
2Wanzenböck, Heinz D. ; Rödiger, Peter ; Hörtlackner, Michael ; Bertagnolli, Emmerich Analysis and evaluation process for quantification of residual gas deposition by a focused electron beamPräsentation Presentation2009
3Wanzenböck, Heinz D. ; Amon, Andreas ; Mika, Johann ; Bertagnolli, Emmerich Axon-Isolation Device fabricated by NanoimprintlithographyPräsentation Presentation2012
4Waid, Simon ; Wanzenböck, Heinz D. ; Bertagnolli, Emmerich Direct Hard Mask Patterning by Focused Ion BeamPräsentation Presentation2011
5Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Bertagnolli, Emmerich Effect of gaseous additives on Electron Beam Induced DepositionPräsentation Presentation2008
6Rödiger, Peter ; Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Bertagnolli, Emmerich Electron beam induced etching of silicon using chlorine gasPräsentation Presentation2010
7Wanzenböck, Heinz D. ; Ismail, Bassem ; Rödiger, Peter ; Greil, Johannes Maximilian ; Hetzel, Martin ; Lugstein, Alois ; Bertagnolli, Emmerich Engineering electrical properties of Silicon nanowires by focused electron beam induced processing with ChlorinePräsentation Presentation2012
8Rödiger, Peter ; Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Bertagnolli, Emmerich Etching of Germanium by Chlorine Gas using a Focused Electron BeamPräsentation Presentation2011
9Wanzenböck, Heinz D. ; Shawrav, Mostafa Moonir ; Wachter, Stefan ; Gavagnin, Marco ; Bertagnolli, Emmerich Expanding nanomagnetic logic into the third dimension New pathways via FEBIDKonferenzbeitrag Inproceedings2015
10Hochleitner, Gottfried ; Hörtlackner, Michael ; Rödiger, Peter ; Wanzenböck, Heinz D. ; Bertagnolli, Emmerich Experimental evaluation of gas-flux distribution with gas injection systems for focused beam induced depositionKonferenzbeitrag Inproceedings2010
11Wanzenböck, Heinz D. ; Waid, Simon ; Bertagnolli, Emmerich Fabrication of 3-dimensional Nanoimprint Stamps A comparison of 4 approaches using FIBPräsentation Presentation2012
12Wanzenböck, Heinz D. ; Rödiger, Peter ; Waid, Simon ; Hochleitner, Gottfried ; Bertagnolli, Emmerich Focused Beam Induced Etching - Making the Right Choice Between Ions and ElectronsPräsentation Presentation2011
13Gavagnin, Marco ; Wanzenböck, Heinz D. ; Waid, Simon ; Bertagnolli, Emmerich Focused Electron Beam Induced Deposition as novel nanofabrication approach for magnetic nanosensors and nanomagnet logicPräsentation Presentation2012
14Wanzenböck, Heinz D. ; Shawrav, Mostafa Moonir ; Mika, Johann ; Waid, Simon ; Gökdeniz, Z.G. ; Rödiger, Peter ; Bertagnolli, Emmerich Focused Electron Beam Induced Etching - Advantages, Features & Limitations of FEBIE with ChlorineKonferenzbeitrag Inproceedings2015
15Rödiger, Peter ; Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Lugstein, Alois ; Bertagnolli, Emmerich Local, Direct-Write, Damage-Free Thinning of Germanium NanowiresPräsentation Presentation2011
16Gavagnin, Marco ; Wanzenböck, Heinz D. ; Waid, Simon ; Bertagnolli, Emmerich Magnetic reversal of iron nanowires deposited by Focused Electron Beam Induced Deposition for nanomagnet logic applicationPräsentation Presentation2012
17Hochleitner, Gottfried ; Lugstein, Alois ; Rödiger, Peter ; Wanzenböck, Heinz D. ; Bertagnolli, Emmerich Nanowire Synthesis on catalyst arrays produced with electron beam induced depositionKonferenzbeitrag Inproceedings2010
18Rödiger, Peter ; Wanzenböck, Heinz D. ; Hochleitner, Gottfried ; Waid, Simon ; Bertagnolli, Emmerich Removal of FIB-Induced Amorphization and Gallium Contamination by Focused-Electron-Beam-Induced-EtchingPräsentation Presentation2011
19Hochleitner, Gottfried ; Hörtlackner, Michael ; Rödiger, Peter ; Wanzenböck, Heinz D. ; Bertagnolli, Emmerich Thermally assisted focused electron beam induced depositionKonferenzbeitrag Inproceedings2010
20Shawrav, Mostafa Moonir ; Wanzenböck, Heinz D. ; Taus, Philip ; Gökdeniz, Z.G. ; Bertagnolli, Emmerich Towards high purity FEBID gold nanostructures - a comparison of purification approachesKonferenzbeitrag Inproceedings2015