International Reliability Physics Symposium

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Description

Event name
International Reliability Physics Symposium
 
Start date
02-05-2010
End date
06-05-2010
 
Location
Anaheim, California
Country
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

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Date Issued:  [2000 TO 2022]

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PreviewAuthor(s)TitleTypeIssue Date
1Shrivastava, Mayank ; Bychikhin, Sergey ; Pogany, Dionyz ; Schneider, Jens ; Shojaei, M ; Gossner, Harald ; Gornik, Erich ; Ramgopal Rao, V On the differences between 3D filamentation and failure of N & P type drain extended MOS devices under ESD conditionsKonferenzbeitrag Inproceedings2010