The 23rd International Conference on Defects in Semiconductors

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Description

Event name
The 23rd International Conference on Defects in Semiconductors
 
Event type
Event for scientific audience
 
Start date
24-07-2005
End date
29-07-2005
 
Location
Awaji Island/ Japan
Country
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

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Author:  Lips, K.

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PreviewAuthor(s)TitleTypeIssue Date
1Petter, K. ; Eyidi, Dominique ; Stöger-Pollach, Michael ; Sieber, I. ; Schubert-Bischoff, P. ; Rau, B. ; Tham, A.T. ; Schattschneider, Peter ; Gall, S. ; Lips, K. ; Fuhs, W. Line defects in epitaxial silicon films grown at 560°CPräsentation Presentation2005