18th International Vacuum Congress (IVC-18)

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Description

Event name
18th International Vacuum Congress (IVC-18)
 
Event type
Event for scientific audience
 
Start date
26-08-2010
Location
Beijing/China
Country
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

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Subject:  spatial resolution

Results 1-1 of 1 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Horkel, Maximilian ; Eisenmenger-Sittner, Christoph ; Mathé, J. ; Eder, A. ; Beniaminov, R. ; Zawrel, R. Determination of the thickness and the refraction index of dielectric thin films with spatial resolution using optical consumer electronic componentsPräsentation Presentation2010