TXRF 2011 Conference

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Description

Event name
TXRF 2011 Conference
 
Event type
Event for scientific audience
 
Start date
07-06-2011
End date
09-06-2011
 
Location
Dortmund, Germany
Country
Europe
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Filter:
Author:  Kregsamer, Peter

Results 1-5 of 5 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Wastl, A. ; Bogner, B. ; Kregsamer, Peter ; Wobrauschek, Peter ; Streli, Christina Gunshot residue investigations using TXRFPräsentation Presentation2011
2Horntrich, C. ; Kregsamer, Peter ; Wobrauschek, Peter ; Nutsch, A. ; Streli, Christina Improvement of calibration processes in TXRF of wafer surface analysis: Investigation of saturation effects in TXRF by comparing different sample shapesPräsentation Presentation2011
3Horntrich, C. ; Kregsamer, Peter ; Smolek, S. ; Maderitsch, A. ; Wobrauschek, Peter ; Simon, R. ; Nutsch, A. ; Streli, Christina Influence of the excitation energy on absorption effects in TXRF analysisPräsentation Presentation2011
4Kregsamer, Peter ; Nutsch, A. ; Borionetti, G. ; Beckhoff, B. ; Müller, M. ; Polignano, M.L. ; Pepponi, Giancarlo ; Fittschen, U. ; Streli, Christina Round robin test for TXRF and ToF-SIMS on various types of Ni samples on Si wafer surfaces within the network ANNAPräsentation Presentation2011
5Polgari, Z. ; Szoboszlai, N. ; Ajtony, Zs. ; Kregsamer, Peter ; Streli, Christina ; Réti, Andrea ; Budai, B. ; Mihucz, V.G. ; Zaray, G. TXRF and GF-AAS methods for the determination of Fe, Cu and Zn in human cell samplesPräsentation Presentation2011