ICXOM 2013

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Description

Event name
ICXOM 2013
 
Event type
Event for scientific audience
 
Start date
02-09-2013
End date
06-09-2013
 
Location
Hamburg, Germany
Country
Europe
 
Event format Veranstaltungsformat
On Site

Publications Publikationen

Filter:
Author:  Schiebl, M.

Results 1-2 of 2 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Schiebl, M. ; Ingerle, D. ; Streli, Christina ; Wobrauschek, Peter Instrumental setup for simultaneous GIXRF and XRR measurement for Characterization of thin films on Si wafersPräsentation Presentation2013
2Ingerle, D. ; Pepponi, Giancarlo ; Meirer, F. ; Schiebl, M. ; Giubertoni, Damiano ; Demenev, E. ; Wobrauschek, Peter ; Streli, Christina New approach for characterization of ultra-shallow implants by simultaneous evaluation of GIXRF and XRRPräsentation Presentation2013