Applied Physics Letters

Title Titel

e-ISSN

1077-3118

ISSN

0003-6951

Publisher Herausgeber

AIP PUBLISHING

Publisher's Address Herausgeber Adresse

1305 WALT WHITMAN RD, STE 300, MELVILLE, USA, NY, 11747-4501

Listed in SCI Aufgelistet im SCI

Peer reviewed Begutachtet

Filter:

Subject: Dark field microscopy

Results 1-1 of 1 (Search time: 0.001 seconds).

RIS EndNote Bibtex Send via email

		Preview	Author(s)	Title	Type	Issue Date
	1		Haiden, Christoph ; Wopelka, Thomas ; Jech, Martin ; Keplinger, Franz ; Vellekoop, Michael J.	Concurrent particle diffusion and sedimentation measurements using two-dimensional tracking in a vertical sample arrangement	Artikel Article	2016