IEEE Transactions on Electron Devices

Title Titel
IEEE Transactions on Electron Devices
 
e-ISSN
1557-9646
 
ISSN
0018-9383
 
Publisher Herausgeber
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
 
Publisher's Address Herausgeber Adresse
445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

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Date Issued:  [2000 TO 2024]

Results 1-20 of 84 (Search time: 0.006 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Karaca, Hasan ; Holland, Steffen ; Ritter, Hans-Martin ; Kumar, Vasantha ; Notermans, Guido ; Pogany, Dionyz 3-D TCAD Methodology for Simulating Double-Hysteresis Filamentary IV Behavior and Holding Current in ESD Protection SCRsArtikel Article 2021
2Aichinger, T. ; Nelhiebel, M. ; Grasser, Tibor A Combined Study of p- and n-Channel MOS Devices to Investigate the Energetic Distribution of Oxide Traps After NBTIArtikel Article2009
3Ghobadi, Nayereh ; Pourfath, Mahdi A Comparative Study of Tunneling FETs Based on Graphene and GNR HeterostructuresArtikel Article2014
4Azar, Nima Sefidmooye ; Pourfath, Mahdi A Comprehensive Study of Transistors Based on Conductive Polymer Matrix CompositesArtikel Article 2015
5Djavid, Nima ; Khaliji, Kaveh ; Tabatabaei, Seyed Mohammad ; Pourfath, Mahdi A Computational Study on the Electronic Transport Properties of Ultra-Narrow Disordered Zigzag Graphene NanoribbonsArtikel Article2014
6Yazdanpanah, Arash ; Pourfath, Mahdi ; Fathipour, Morteza ; Kosina, Hans ; Selberherr, Siegfried A Numerical Study of Line-Edge Roughness Scattering in Graphene NanoribbonsArtikel Article2012
7Ahsan, Sheikh Aamir ; Singh, Shivendra Kumar ; Mir, Mehak Ashraf ; Perucchini, Marta ; Polyushkin, Dmitry K. ; Mueller, Thomas ; Fiori, Gianluca ; Marin, Enrique G. A SPICE Compact Model for Ambipolar 2-D-Material FETs Aiming at Circuit DesignArtikel Article 2021
8Goharrizi, Arash Yazdanpanah ; Pourfath, Mahdi ; Fathipour, Morteza ; Kosina, Hans ; Selberherr, Siegfried An Analytical Model for Line-Edge Roughness Limited Mobility of Graphene NanoribbonsArtikel Article2011
9Rigato, Matteo ; Fleury, Clement ; Schwarz, Benedikt ; Mergens, Markus ; Bychikhin, Sergey ; Simburger, Werner ; Pogany, Dionyz Analysis of ESD Beheviour of Stacked nMOSFET RF Switches in Bulk TechnologyArtikel Article 2018
10Vasicek, Martin ; Cervenka, Johann ; Esseni, David ; Palestri, Pierpaolo ; Grasser, Tibor Applicability of Macroscopic Transport Models to Decananometer MOSFETsArtikel Article2012
11Ruch, Bernhard ; Jech, Markus ; Pobegen, Gregor ; Grasser, Tibor Applicability of Shockley-Read-Hall Theory for Interface StatesArtikel Article 2021
12Gholipour, M. ; Masoumi, N. ; Chen, Y. C. ; Chen, D. ; Pourfath, Mahdi Asymmetric Gate Schottky-Barrier Graphene Nanoribbon FETs for Low-Power DesignArtikel Article 2014
13Karamitaheri, Hossein ; Pourfath, Mahdi ; Faez, Rahim ; Kosina, Hans Atomistic Study of the Lattice Thermal Conductivity of Rough Graphene NanoribbonsArtikel Article2013
14Johnsson, David ; Pogany, Dionyz ; Willemen, Joost ; Gornik, Erich ; Stecher, Matthias Avalanche Breakdown Delay in ESD Protection DiodesArtikel Article2010
15Stradiotto, Roberta ; Pobegen, Gregor ; Ostermaier, Clemens ; Waltl, Michael ; Grill, Alexander ; Grasser, Tibor Characterization of Interface Defects With Distributed Activation Energies in GaN-Based MIS-HEMTsArtikel Article 2017
16Palestri, P ; Barin, N ; Brunel, D ; Busseret, C ; Campera, A ; Childs, P ; Driussi, F ; Fiegna, C. ; Fiori, G ; Gusmeroli, R ; Iannaccone, G ; Karner, Markus ; Kosina, Hans ; Lacaita, Andrea Leonardo ; Langer, Erasmus ; Majkusiak, Bogdan ; Monzio Compagnoni, C ; Poncet, A ; Sangiorgi, E. ; Selmi, L ; Spinelli, A ; Walczak, J Comparison of Modeling Approaches for the Capacitance-Voltage and Current-Voltage Characteristics of Advanced Gate StacksArtikel Article Jan-2007
17Lagger, Peter ; Reiner, Maria ; Pogany, Dionyz ; Ostermaier, Clemens Comprehensive Study of the Complex Dynamics of Forward Bias-Induced Threshold Voltage Drifts in GaN Based MIS-HEMTs by Stress/Recovery ExperimentsArtikel Article 2014
18Sverdlov, Viktor ; El-Sayed, Al-Moatasem Bellah ; Kosina, Hans ; Selberherr, Siegfried Conductance in a Nanoribbon of Topologically Insulating MoS₂ in the 1T' PhaseArtikel Article 2020
19Stöber, Laura ; Konrath, J.P. ; Patocka, Florian ; Schneider, Michael ; Schmid, Ulrich Controlling 4H-SiC Schottky Barriers by Molybdenum and Molybdenum Nitride as Contact MaterialsArtikel Article Feb-2016
20Yazdanpanah Goharrizi, Arash ; Pourfath, Mahdi ; Fathipour, Morteza ; Kosina, Hans Device Performance of Graphene Nanoribbon Field-Effect Transistors in the Presence of Line-Edge RoughnessArtikel Article2012