Title Titel
Thin Solid Films
 
e-ISSN
1879-2731
 
ISSN
0040-6090
 
Publisher Herausgeber
ELSEVIER SCIENCE SA
 
Publisher's Address Herausgeber Adresse
PO BOX 564, LAUSANNE, SWITZERLAND, 1001
 
Listed in SCI Aufgelistet im SCI
 
Peer reviewed Begutachtet
 
 

Publications Publikationen

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Subject:  Surfaces, Coatings and Films

Results 1-20 of 42 (Search time: 0.004 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Bayer, B.C. ; Sanjabi, S. ; Baehtz, C. ; Wirth, C.T. ; Esconjauregui, S. ; Weatherup, R.S. ; Barber, Z.H. ; Hofmann, S. ; Robertson, J. Carbon Nanotube forest growth on NiTi Shape Memory Alloy thin films for thermal actuationArtikel Article2011
2Bartosik, M. ; Daniel, R. ; Mitterer, C. ; Matko, I. ; Burghammer, M. ; Mayrhofer, P.H. ; Keckes, J. Cross-sectional X-ray nanobeam diffraction analysis of a compositionally graded CrNₓ thin filmArtikel Article2013
3Giuliani, Finn ; Ciurea, Constantin ; Bhakhri, Vineet ; Werchota, Malcolm ; Vandeperre, Luc J. ; Mayrhofer, Paul H. Deformation behaviour of TiN and Ti-Al-N coatings at 295 to 573KArtikel Article 2019
4Gu, Xunlong ; Zhang, Zaoli ; Bartosik, Matthias ; Mayrhofer, Paul H. ; Duan, Huiping Dislocation densities and alternating strain fields in CrN/AlN nanolayersArtikel Article 2017
5Schmid, U. ; Seidel, H. Effect of High Temperature Annealing on the Electrical Performance of Titanium/Platinum Thin FilmsArtikel Article2008
6Bayer, B.C. ; Khan, A.F. ; Mehmood, M. ; Barber, Z.H. Effect of substrate on processing of multi-gun sputter deposited, near-stoichiometric Ni2MnGa thin filmsArtikel Article2010
7Schmid, U. ; Seidel, H. Effect of Substrate Properties and Thermal Annealing on the Resistivity of Molybdenum Thin FilmsArtikel Article2005
8Pfeiler-Deutschmann, Martin ; Mayrhofer, Paul H. ; Chladil, Kerstin ; Penoy, Marianne ; Michotte, Claude ; Kathrein, Martin ; Mitterer, Christian Effect of wavelength modulation of arc evaporated Ti-Al-N/Ti-Al-V-N multilayer coatings on microstructure and mechanical/tribological propertiesArtikel Article2015
9Novalin, Sabrina ; Rennhofer, Marcus ; Summhammer, Johann Electrical metastabilities in chalcogenide photovoltaic devicesArtikel Article2013
10Alexewicz, A. ; Ostermaier, C. ; Henkel, C. ; Bethge, O. ; Carlin, J.-F. ; Lugani, L. ; Grandjean, N. ; Bertagnolli, E. ; Pogany, D. ; Strasser, G. Explanation of threshold voltage scaling in enhancement-mode InAlN/AlN-GaN metal oxide semiconductor high electron mobility transistors on Si substratesArtikel Article 2012
11Hollerweger, R. ; Riedl, H. ; Arndt, M. ; Kolozsvari, S. ; Primig, S. ; Mayrhofer, P.H. Guidelines for increasing the oxidation resistance of Ti-Al-N based coatingsArtikel Article 2019
12Frischmuth, Tobias ; Schneider, Michael ; Maurer, Daniel ; Grille, Thomas ; Schmid, Ulrich High temperature annealing effects on the chemical and mechanical properties of inductively-coupled plasma-enhanced chemical vapor deposited a-SiC:H thin filmsArtikel Article 2016
13Jílek Jr., M. ; Jílek, M. ; Mendez Martin, F. ; Mayrhofer, Paul Heinz ; Veprek, S. High-rate deposition of AlTiN and related coatings with dense morphology by central cylindrical direct current magnetron sputteringArtikel Article2014
14Asanuma, H. ; Klimashin, F.F. ; Polcik, P. ; Kolozsvári, S. ; Riedl, H. ; Mayrhofer, P.H. Impact of lanthanum and boron on the growth, thermomechanical properties and oxidation resistance of Ti-Al-N thin filmsArtikel Article 2019
15Wistrela, E. ; Schmied, I. ; Schneider, M. ; Gillinger, M. ; Mayrhofer, P.M. ; Bittner, A. ; Schmid, U. Impact of sputter deposition parameters on the microstructural and piezoelectric properties of Cr x Al 1−x N thin filmsArtikel Article 2018
16Schlögl, M. ; Paulitsch, J. ; Keckes, J. ; Mayrhofer, P.H. Influence of AlN Layers on Mechanical Properties and Thermal Stability of Cr-Based Nitride CoatingsArtikel Article2013
17Schlögl, M. ; Mayer, B. ; Paulitsch, J. ; Mayrhofer, P.H. Influence of CrN and AlN layer thicknesses on structure and mechanical properties of CrN/AlN superlatticesArtikel Article2013
18Riedl, H. ; Koller, C.M. ; Munnik, F. ; Hutter, H. ; Mendez Martin, F. ; Rachbauer, R. ; Kolozsvári, S. ; Bartosik, M. ; Mayrhofer, P.H. Influence of oxygen impurities on growth morphology, structure and mechanical properties of Ti-Al-N thin filmsArtikel Article 2016
19Gall, S. ; Schneider, J. ; Klein, J. ; Hübener, K. ; Muske, M. ; Rau, B. ; Conrad, E. ; Sieber, I. ; Petter, K. ; Lips, K. ; Stöger-Pollach, M. ; Schattschneider, P. ; Fuhs, W. Large-grained polycrystalline silicon on glass for thin-film solar cellsArtikel Article2006
20Bohnenberger, Timo ; Schmid, Ulrich Layer-by-layer approach for deposition of pure carbon nanotubes and composite films for use as electrodes in electrochemical devicesArtikel Article2014