Institut für Mikroelektronik

Organization Name (de) Name der Organisation (de)
E360 - Institut für Mikroelektronik
 
Code Kennzahl
E360
 
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Institute
Parent OrgUnit Übergeordnete Organisation
 
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PreviewAuthor(s)TitleTypeIssue Date
1Sokolovic, Igor ; Guedes, Eduardo ; van Waas, Thomas ; Poncé, Samuel ; Polley, Craig ; Schmid, Michael ; Diebold, Ulrike ; Radović, Milan ; Setvin, Martin ; Dil, Hugo Two-dimensional electron liquids at truly bulk-terminated SrTiO₃Presentation Vortrag22-Mar-2024
2Sokolovic, Igor ; Rasouli, Saeed ; Wu, Bing ; Sofer, Zdeněk ; Matković, Aleksandar ; Schmid, Michael ; Diebold, Ulrike ; Grasser, Tibor PtSe₂ vdW single-crystal surfaces studied at the atomic scale with ncAFMPresentation Vortrag19-Mar-2024
3Etl-2024-JOURNAL OF PHYSICS A-MATHEMATICAL AND THEORETICAL-vor.pdf.jpgEtl, Clemens ; Ballicchia, Mauro ; Nedjalkov, Mihail ; Weinbub, Josef Wigner Transport in Linear Electromagnetic FieldsArticle Artikel 15-Mar-2024
4Jorstad-2024-PHYSICA B-CONDENSED MATTER-vor.pdf.jpgJorstad, Nils Petter ; Fiorentini, Simone ; Ender, Johannes ; Wolfgang Goes ; Selberherr, Siegfried ; Sverdlov, Viktor Micromagnetic modeling of SOT-MRAM dynamicsArticle Artikel 1-Mar-2024
5Hamidi, Hoda ; Shojaei, F. ; Pourfath, Mahdi ; Vaez zadeh, Mehdi Adsorption behavior of some green corrosion inhibitors on Fe (110) surface: The critical role of d-π interactions in binding strengthArticle Artikel 17-Jan-2024
6Hadamek, Tomas ; Jorstad, Nils Petter ; Goes, Wolfgang ; Selberherr, Siegfried ; Sverdlov, Viktor Numerical study of two-terminal SOT-MRAMArticle Artikel 15-Jan-2024
7Reiter-2023-Solid-State Electronics-vor.pdf.jpgReiter, Tobias ; Aguinsky, Luiz Felipe ; Souza Berti Rodrigues, Francio ; Weinbub, Josef ; Hössinger, Andreas ; Filipovic, Lado Modeling the Impact of Incomplete Conformality During Atomic Layer ProcessingArticle Artikel Jan-2024
8Tselios Konstantinos - 2024 - Statistical Analysis of Reliability and...pdf.jpgTselios, Konstantinos Statistical analysis of reliability and variability effects in CMOS technologies based on single-defect spectroscopyThesis Hochschulschrift 2024
9Shayanfar, Reza ; Alidoosti, Mohammad ; Nasr Esfahani, Davoud ; Pourfath, Mahdi The carrier mobility and superconducting properties of monolayer oxygen-terminated functionalized MXene Ti₂CO₂Article Artikel 14-Dec-2023
10Bendra, Mario ; Jorstad, Nils Petter ; Lacerda de Orio, Roberto ; Selberherr, Siegfried ; Goes, Wolfgang ; Sverdlov, Viktor Unified Modeling of Ultra-Scaled STT-MRAM Cells: Harnessing Parasitic Effects for Enhanced Data Storage DynamicsInproceedings Konferenzbeitrag 9-Dec-2023
11Ballicchia, Mauro ; Etl, Clemens ; Nedjalkov, Mihail ; Weinbub, Josef Controlling Single Electrons by Non-Uniform Magnetic FieldsInproceedings Konferenzbeitrag 3-Dec-2023
12Sverdlov, Viktor ; Bendra, Mario ; Jorstad, Nils Petter ; Pruckner, Bernhard ; Hadamek, Tomas ; Goes, Wolfgang ; Selberherr, Siegfried Multi-bit Operation in an MRAM Cell with a Composite Free LayerInproceedings Konferenzbeitrag 3-Dec-2023
13Lashani Zand-2023-ACS Omega-vor.pdf.jpgLashani Zand, Ali ; Niksirat, Amin ; Sanaee, Zeinab ; Pourfath, Mahdi Comprehensive study of lithium diffusion in Si/C-layer and Si/C₃N₄ composites in a faceted crystalline silicon anode for fast-charging lithium-ion batteriesArticle Artikel 28-Nov-2023
14Filipovic, Lado ; Bobinac, Josip ; Piso, Julius ; Reiter, Tobias Physics-Informed Compact Model for SF6/O2 Plasma EtchingInproceedings Konferenzbeitrag20-Nov-2023
15Leroch, Sabine ; Stella, Robert ; Hössinger, Andreas ; Filipovic, Lado Molecular Dynamics Study of Al Implantation in 4H-SiCInproceedings Konferenzbeitrag20-Nov-2023
16Reiter, Tobias ; Toifl, Alexander ; Hössinger, Andreas ; Filipovic, Lado Modeling Oxide Regrowth During Selective Etching in Vertical 3D NAND StructuresInproceedings Konferenzbeitrag20-Nov-2023
17Wilhelmer, Christoph ; Waldhör, Dominic ; Milardovich, Diego ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Intrinsic Electron Trapping in Amorphous Silicon Nitride (a-Si3N4:H)Inproceedings Konferenzbeitrag20-Nov-2023
18Hadamek, Tomas ; Jorstad, Nils Petter ; Goes, Wolfgang ; Selberherr, Siegfried ; Sverdlov, Viktor Study of Self-Heating and its Effects in SOT-STT-MRAMInproceedings Konferenzbeitrag20-Nov-2023
19Ferry, David K. ; Oriols, Xavier ; Weinbub, Josef Quantum Transport in Semiconductor Devices: Simulation Using ParticlesBook BuchNov-2023
20Jorstad, Nils Petter ; Hadamek, Tomas ; Bendra, Mario ; Ender, Johannes ; Pruckner, Bernhard ; Goes, Wolfgang ; Sverdlov, Viktor Numerical Simulations of Spintronic Magnetoresistive MemoriesInproceedings Konferenzbeitrag26-Oct-2023