Institut für Mikroelektronik

Organization Name (de) Name der Organisation (de)
E360 - Institut für Mikroelektronik
 
Code Kennzahl
E360
 
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Institute
Parent OrgUnit Übergeordnete Organisation
 
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PreviewAuthors / EditorsTitleTypeIssue Date
61Wilhelmer, Christoph ; Milardovich, Diego ; Waldhör, Dominic ; Cvitkovich, Lukas ; Waltl, Michael ; Grasser, Tibor Charged instrinsic defect states in amorphous Si3N4Presentation Vortrag29-May-2023
62Jagannathan, H. ; Martino, J. ; Karim, Z. ; Kakushima, K. ; Timans, P.J. ; Gousev, E. ; De Gendt, S. ; Misra, D. ; Obeng, Y. ; Roozeboom, F. ; Nguyen, B. ; Raskin, J. ; Gamiz, F. ; Selberherr, Siegfried ; Simoen, E. ; Ishii, H. Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 13 & Advanced CMOS-Compatible Semiconductor Devices 20Proceedings Tagungsband 28-May-2023
63Knobloch, Theresia ; Grasser, Tibor Gate Stack Design for Field-Effect Transistors Based on Two-Dimensional MaterialsInproceedings Konferenzbeitrag 28-May-2023
64Knobloch, Theresia ; Selberherr, Siegfried ; Grasser, Tibor High-Performance Field-Effect Transistors Based on Two-Dimensional Materials for VLSI CircuitsInproceedings Konferenzbeitrag28-May-2023
65Bendra, Mario ; Fiorentini, Simone ; Ender, Johannes ; Lacerda de Orio, Roberto ; Hadamek, Tomas ; Jorstad, Nils Petter ; Pruckner, Bernhard ; Selberherr, Siegfried ; Goes, Wolfgang ; Sverdlov, Viktor Back-Hopping in Ultra-Scaled MRAM CellsInproceedings Konferenzbeitrag 22-May-2023
66Knobloch, Theresia ; Selberherr, Siegfried ; Grasser, Tibor High-Performance Field-Effect Transistors Based on Two-Dimensional Materials for VLSI CircuitsArticle Artikel 19-May-2023
67HosseinpourRokni, Mohsen ; Naderi, Reza ; Soleimani, Maryam ; Kowsari, Elaheh ; Pourfath, Mahdi Indirect interactions between the ionic liquid and Cu surface in 0.5 M HCl: a novel mechanism explaining cathodic corrosion inhibitionArticle Artikel 15-May-2023
68Bendra, Mario ; Fiorentini, Simone ; Selberherr, Siegfried ; Goes, Wolfgang ; Sverdlov, Viktor A Multi-Level Cell for Ultra-Scaled STT-MRAM Realized by Back-HoppingInproceedings Konferenzbeitrag 10-May-2023
69Gull, Josef ; Kosina, Hans Monte-Carlo Investigation of Energy Distributions in FET ChannelsInproceedings Konferenzbeitrag 10-May-2023
70Leroch, S. ; Eder, Stefan ; Varga, M. ; Rodríguez Ripoll, M. Material point simulations as a basis for determining Johnson–Cook hardening parameters via instrumented scratch testsArticle Artikel 1-Apr-2023
71Bobinac, Josip ; Reiter, Tobias ; Piso, Julius ; Klemenschits, Xaver ; Baumgartner, Oskar ; Stanojevic, Zlatan ; Strof, Georg ; Karner, Markus ; Filipovic, Lado Effect of Mask Geometry Variation on Plasma Etching ProfilesArticle Artikel 16-Mar-2023
72Bobinac-2023-Micromachines-vor.pdf.jpgBobinac, Josip ; Reiter, Tobias ; Piso, Julius ; Klemenschits, Xaver ; Baumgartner, Oskar ; Stanojevic, Zlatan ; Strof, Georg ; Karner, Markus ; Filipovic, Lado Effect of Mask Geometry Variation on Plasma Etching ProfilesArticle Artikel 16-Mar-2023
73Ceric, Hajdin ; Zahedmanesh, Houman ; Croes, Kristof ; Lacerda de Orio, Roberto ; Selberherr, Siegfried Electromigration-Induced Void Evolution and Failure of Cu/SiCN Hybrid BondsArticle Artikel 14-Mar-2023
74Weinbub, Josef ; Ballicchia, Mauro ; Etl, Clemens ; Nedjalkov, Mihail Wigner Signed Particles for Electron Quantum OpticsPresentation Vortrag6-Mar-2023
75Soleimani, Maryam ; Pourfath, Mahdi A comprehensive investigation of the plasmonic-photocatalytic properties of gold nanoparticles for CO₂ conversion to chemicalsArticle Artikel 2-Mar-2023
76Bendra-2023-Solid-State Electronics-vor.pdf.jpgBendra, Mario ; Fiorentini, Simone ; Goes, Wolfgang ; Selberherr, Siegfried ; Sverdlov, Viktor The Influence of Interface Effects on the Switching Behavior in Ultra-Scaled MRAM CellsArticle Artikel Mar-2023
77Aguinsky-2023-Solid-State Electronics-vor.pdf.jpgAguinsky, Luiz Felipe ; Souza Berti Rodrigues, Francio ; Reiter, Tobias ; Klemenschits, Xaver ; Filipovic, Lado ; Hössinger, Andreas ; Weinbub, Josef Modeling Incomplete Conformality During Atomic Layer Deposition in High Aspect Ratio StructuresArticle Artikel Mar-2023
78Lenz-2023-Journal of Scientific Computing-vor.pdf.jpgLenz, Christoph ; Aguinsky, Luiz Felipe ; Hössinger, Andreas ; Weinbub, Josef A Complementary Topographic Feature Detection Algorithm Based on Surface Curvature for Three-Dimensional Level-Set FunctionsArticle Artikel Mar-2023
79Sverdlov, Viktor ; El-Sayed, Al-Moatasem Bellah ; Seiler, Heribert ; Kosina, Hans Edge States Dispersion in Narrow Nanoribbons of 2D Transition Metal Dichalcogenides in the 1T′ Topological PhaseInproceedings Konferenzbeitrag12-Feb-2023
80Bendra, Mario ; Fiorentini, Simone ; Hadamek, Tomas ; Jorstad, Nils Petter ; Ender, Johannes ; Lacerda de Orio, Roberto ; Selberherr, Siegfried ; Goes, Wolfgang ; Sverdlov, Viktor Switching Composite Free Layers in Ultra-Scaled MRAM CellsInproceedings Konferenzbeitrag12-Feb-2023