Forschungsbereich Intelligente Mechatronische Systeme

Organization Name (de) Name der Organisation (de)
E376-01 - Forschungsbereich Intelligente Mechatronische Systeme
 
Code Kennzahl
E376-01
 
Type of Organization Organisationstyp
Research Division
Parent OrgUnit Übergeordnete Organisation
 
Active Aktiv
 


Results 181-200 of 473 (Search time: 0.002 seconds).

PreviewAuthor(s)TitleTypeIssue Date
181Fuerst, M ; Unger, S ; Ito, S ; Schitter, G Wavefront measurement based feedback control for automatic alignment of a high-NA optical systemArtikel Article 2018
182Schlarp, Johannes ; Csencsics, Ernst ; Schitter, Georg Influence of Scheimpflug condition on measurements of a scanning laser line sensor for 3D imagingArtikel Article 2018
183Poik, Matthias ; Kohl, Dominik ; Schitter, Georg Similarity-based Feedback Control for Linear Operation of Piezoelectric ActuatorsKonferenzbeitrag Inproceedings 2018
184Bibl, Matthias ; Zech, Christoph ; Schitter, Georg Design and Control of a Ball on Ball System With a Programmable Logic Controller and Vision FeedbackKonferenzbeitrag Inproceedings 2018
185Schroedter, Richard ; Schwarzenberg, Markus ; Dreyhaupt, Andre ; Barth, Robert ; Sandner, Thilo ; Janschek, Klaus Microcontroller based closed-loop control of a 2D quasi-static/resonant microscanner with on-chip piezo-resistive sensor feedbackKonferenzbeitrag Inproceedings2017
186Csencsics, Ernst ; Ito, Shingo ; Fuerst, Martin ; Schlarp, Johannes ; Cigarini, Francesco ; Schitter, Georg Christian Doppler Laboratory "Precision Engineering for Automated In-line Metrology"Präsentation Presentation2017
187Mesquida, Patrick ; Kohl, Dominik ; Andriotis, Orestis G. ; Thurner, Philipp J. ; Duer, Melinda J. ; Bansode, S. B. ; Schitter, Georg Kelvin-Probe Force Microscopy to Map Glycation of ProteinsPräsentation Presentation2017
188Kohl, Dominik ; Mesquida, Patrick ; Schitter, Georg Pitfalls of practical KPFM-phase-tuning leading to polarity reversal on biological samplesPräsentation Presentation2017
189Schitter, Georg Scientific Instrumentation for Atomic Force Microscopy: Adding Speed and VersatilityPräsentation Presentation2017
190Schitter, Georg Scientific instrumentation for atomic force microscopy:adding speed and versatilityPräsentation Presentation2017
191Steinegger, Michael ; Melik-Merkumians, Martin ; Schitter, Georg Ontology-based framework for the generation of interlock code with redundancy eliminationKonferenzbeitrag Inproceedings 2017
192Csencsics, Ernst ; Schitter, Georg Parametric PID Controller Tuning for a Fast Steering MirrorKonferenzbeitrag Inproceedings 2017
193Sinn, Andreas ; Riel, Thomas ; Deisl, Florian ; Schitter, Georg Tip-tilt vibration compensation: A system analysisKonferenzbeitrag Inproceedings2017
194Kohl, Dominik ; Kerschner, Christoph ; Schitter, Georg Automatic Fourier Synthesis Based Input-Shaping for Scanning Piezo-Electric ActuatorsKonferenzbeitrag Inproceedings 2017
195Csencsics, Ernst ; Schlarp, Johannes ; Schitter, Georg Bandwidth extension of hybrid-reluctance-force-based tip/tilt system by reduction of eddy currentsKonferenzbeitrag Inproceedings 2017
196Csencsics, Ernst ; Schitter, Georg Design of a phase-locked-loop-based control scheme for Lissajous-trajectory scanning of fast steering mirrorsKonferenzbeitrag Inproceedings 2017
197Riel, Thomas ; Galffy, Andras ; Sinn, Andreas ; Schitter, Georg Improvement of the angular precision of an optical metrology platform by disturbance compensationKonferenzbeitrag Inproceedings2017
198Kohl, Dominik ; Mesquida, Patrick ; Schitter, Georg Multi-frequency Kelvin Probe Force Microscopy Method for Charge Mapping Without DC-BiasPräsentation Presentation2017
199Mesquida, Patrick ; Stone, A. ; Ruiz, L. ; Kohl, Dominik ; Andriotis, Orestis G. ; Schitter, Georg Using Electrostatic Force Microscopy to Map Biophysical and Biochemical Processes at High ResolutionPräsentation Presentation2017
200Ito, Shingo ; Neyer, Daniel ; Steininger, Jürgen ; Schitter, Georg Dual Actuation of Fast Scanning Axis for High-speed Atomic Force MicroscopyKonferenzbeitrag Inproceedings 2017