Forschungsbereich Mikroelektronik

Organization Name (de) Name der Organisation (de)
E360-01 - Forschungsbereich Mikroelektronik
 
Code Kennzahl
E360-01
 
Type of Organization Organisationstyp
Research Division
Parent OrgUnit Übergeordnete Organisation
 
Active Aktiv
 


Results 1-20 of 55 (Search time: 0.004 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Jorstad-2024-PHYSICA B-CONDENSED MATTER-vor.pdf.jpgJorstad, Nils Petter ; Fiorentini, Simone ; Ender, Johannes ; Wolfgang Goes ; Selberherr, Siegfried ; Sverdlov, Viktor Micromagnetic modeling of SOT-MRAM dynamicsArticle Artikel 1-Mar-2024
2Hadamek, Tomas ; Jorstad, Nils Petter ; Goes, Wolfgang ; Selberherr, Siegfried ; Sverdlov, Viktor Numerical study of two-terminal SOT-MRAMArticle Artikel 15-Jan-2024
3Shayanfar, Reza ; Alidoosti, Mohammad ; Nasr Esfahani, Davoud ; Pourfath, Mahdi The carrier mobility and superconducting properties of monolayer oxygen-terminated functionalized MXene Ti₂CO₂Article Artikel 14-Dec-2023
4Bendra-2023-Solid-State Electronics-vor.pdf.jpgBendra, Mario ; Fiorentini, Simone ; Selberherr, Siegfried ; Gös, Wolfgang ; Sverdlov, Viktor A multi-level cell for ultra-scaled STT-MRAM realized by back-hoppingArticle Artikel Oct-2023
5Souza Berti Rodrigues-2023-Journal of Computational Electronics-vor.pdf.jpgSouza Berti Rodrigues, Francio ; Aguinsky, Luiz Felipe ; Lenz, Christoph ; Hössinger, Andreas ; Weinbub, Josef 3D modeling of feature-scale fluorocarbon plasma etching in silicaArticle Artikel Oct-2023
6Gull-2023-Solid-State Electronics-vor.pdf.jpgGull, Josef ; Kosina, Hans Monte Carlo study of electron–electron scattering effects in FET channelsArticle Artikel Oct-2023
7Shobeyrian, F. ; Shojaei, F. ; Soleimani, M. ; Pourfath, M. Two-dimensional Cr₂X₂Y₆ (X = Si, Ge; Y = S, Se, Te) family with potential application in photocatalysisArticle Artikel 1-Sep-2023
8Ceric, Hajdin ; Lacerda de Orio, Roberto ; Selberherr, Siegfried Statistical Study of Electromigration in Gold InterconnectsArticle Artikel Aug-2023
9Hadamek-2023-Micromachines-vor.pdf.jpgHadamek, Tomas ; Jorstad, Nils Petter ; Lacerda de Orio, Roberto ; Goes, Wolfgang ; Selberherr, Siegfried ; Sverdlov, Viktor A Comprehensive Study of Temperature and Its Effects in SOT-MRAM DevicesArticle Artikel Aug-2023
10Akhound, M.A. ; Soleimani, M. ; Pourfath, M. Controllable Gas Adsorption via Inter-Coupled Ferroelectricity in In₂Se₃ MonolayerArticle Artikel 3-Jul-2023
11Zarate-Galvez-2023-ECS Journal of Solid State Science and Technology-vor.PDF.jpgZarate-Galvez, Sarai ; Garcia-Barrientos, Abel ; Lastras-Martinez, Luis Felipe ; Cardenas-Juarez, Marco ; Macias-Velasquez, Sharon ; Filipovic, Lado ; Arce-Casas, Armando Optimization of Doping Concentration to Obtain High Internal Quantum Efficiency and Wavelength Stability in An InGaN/GaN Blue Light-Emitting DiodeArticle Artikel Jul-2023
12Medina-Bailon-2023-Nano Express-vor.pdf.jpgMedina-Bailon, Cristina ; Nedialkov, Mihail Hristov ; Georgiev, Vihar ; Selberherr, Siegfried ; Asenov, Asen Comprehensive mobility study of silicon nanowire transistors using multi-subband modelsArticle Artikel Jun-2023
13HosseinpourRokni, Mohsen ; Naderi, Reza ; Soleimani, Maryam ; Kowsari, Elaheh ; Pourfath, Mahdi Indirect interactions between the ionic liquid and Cu surface in 0.5 M HCl: a novel mechanism explaining cathodic corrosion inhibitionArticle Artikel 15-May-2023
14Leroch, S. ; Eder, Stefan ; Varga, M. ; Rodríguez Ripoll, M. Material point simulations as a basis for determining Johnson–Cook hardening parameters via instrumented scratch testsArticle Artikel 1-Apr-2023
15Bobinac, Josip ; Reiter, Tobias ; Piso, Julius ; Klemenschits, Xaver ; Baumgartner, Oskar ; Stanojevic, Zlatan ; Strof, Georg ; Karner, Markus ; Filipovic, Lado Effect of Mask Geometry Variation on Plasma Etching ProfilesArticle Artikel 16-Mar-2023
16Bobinac-2023-Micromachines-vor.pdf.jpgBobinac, Josip ; Reiter, Tobias ; Piso, Julius ; Klemenschits, Xaver ; Baumgartner, Oskar ; Stanojevic, Zlatan ; Strof, Georg ; Karner, Markus ; Filipovic, Lado Effect of Mask Geometry Variation on Plasma Etching ProfilesArticle Artikel 16-Mar-2023
17Ceric, Hajdin ; Zahedmanesh, Houman ; Croes, Kristof ; Lacerda de Orio, Roberto ; Selberherr, Siegfried Electromigration-Induced Void Evolution and Failure of Cu/SiCN Hybrid BondsArticle Artikel 14-Mar-2023
18Soleimani, Maryam ; Pourfath, Mahdi A comprehensive investigation of the plasmonic-photocatalytic properties of gold nanoparticles for CO₂ conversion to chemicalsArticle Artikel 2-Mar-2023
19Bendra-2023-Solid-State Electronics-vor.pdf.jpgBendra, Mario ; Fiorentini, Simone ; Goes, Wolfgang ; Selberherr, Siegfried ; Sverdlov, Viktor The Influence of Interface Effects on the Switching Behavior in Ultra-Scaled MRAM CellsArticle Artikel Mar-2023
20Aguinsky-2023-Solid-State Electronics-vor.pdf.jpgAguinsky, Luiz Felipe ; Souza Berti Rodrigues, Francio ; Reiter, Tobias ; Klemenschits, Xaver ; Filipovic, Lado ; Hössinger, Andreas ; Weinbub, Josef Modeling Incomplete Conformality During Atomic Layer Deposition in High Aspect Ratio StructuresArticle Artikel Mar-2023