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Denifl, G.
 

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PreviewAuthor(s)TitleTypeIssue Date
1Lagger, P. ; Steinschifter, P. ; Reiner, M. ; Stadtmüller, M. ; Denifl, G. ; Naumann, A. ; Müller, J. ; Wilde, L. ; Sundqvist, J. ; Pogany, D. ; Ostermaier, C. Role of the dielectric for the charging dynamics of the dielectric/barrier interface in AlGaN/GaN based metal-insulator-semiconductor structures under forward gate bias stressArtikel Article 2014