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Ragnarsson, L. Å.
 

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PreviewAuthor(s)TitleTypeIssue Date
1Toledano-Luque, M. ; Kaczer, B. ; Roussel, Ph. J. ; Franco, J. ; Ragnarsson, L. Å. ; Grasser, T. ; Groeseneken, G. Depth Localization of Positive Charge Trapped in Silicon Oxynitride Field Effect Transistors after Positive and Negative Gate Bias Temperature StressArtikel Article2011