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Cho, M. J.

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		Preview	Author(s)	Title	Type	Issue Date
	1		Toledano-Luque, M. ; Kaczer, B. ; Roussel, Ph. ; Cho, M. J. ; Grasser, T. ; Groeseneken, G.	Temperature Dependence of the Emission and Capture Times of SiON Individual Traps after Positive Bias Temperature Stress	Artikel Article	2011