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Elerman, Y.

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		Preview	Author(s)	Title	Type	Issue Date
	1		Auge, A. ; Teichert, N. ; Meinert, M. ; Reiss, G. ; Hütten, A. ; Yüzüak, E. ; Dincer, I. ; Elerman, Y. ; Ennen, I. ; Schattschneider, P.	Thickness dependence of the martensitic transformation, magnetism, and magnetoresistance in epitaxial Ni-Mn-Sn ultrathin films	Artikel Article	2012