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Daum, W
 

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PreviewAuthor(s)TitleTypeIssue Date
1Döscher, H. ; Lilienkamp, G. ; Iskra, P. ; Daum, W ; Helsch, G. ; Becker, S. ; Wrobel, R. ; Weiss, H. ; Suchorski, Yuri High-quality ZrO₂/Si(001) thin films by a sol-gel process: Preparation and characterizationArtikel Article2010