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Schilcher, K

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		Preview	Author(s)	Title	Type	Issue Date
	1		Huber, H. ; Mörtelmaier, M ; Wallis, T.M. ; Chiang, C.J. ; Hochleitner, M ; Imtiaz, A ; Oh, Y.J. ; Schilcher, K ; Dieudonne, M ; Smoliner, Jürgen ; Hinterdorfer, P ; Rosner, S.J. ; Tanbakuchi, H ; Kabos, P ; Kienberger, F	Calibrated nanoscale capacitance measurements using a scanning microwave microscope	Artikel Article	2010