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Idrissi, Hosni
 
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PreviewAuthor(s)TitleTypeIssue Date
1Colla-2024-New developments of the residual stress actuated on-chip testi...-vor.pdf.jpgColla, Marie-Stephane ; Naceri, Salah Eddine ; Roisin, Nicolas ; Baral, Paul ; Coulombier, Michael ; Idrissi, Hosni ; Flandre, Denis ; Raskin, Jean-Pierre ; Pardoen, Thomas New developments of the residual stress actuated on-chip testing methodInproceedings Konferenzbeitrag May-2024