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Ermilova, Ekaterina

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		Preview	Author(s)	Title	Type	Issue Date
	1		Ermilova, Ekaterina ; Klapetek, Petr ; Pfusterschmied, Georg ; Nanjappan, Chezhiyan ; Schmid, Ulrich ; Hertwig, Andreas	On the Use of Spectroscopic Imaging Ellipsometry for Quantification and Characterisation of Defects in Thin Films for Power Electronics	Presentation Vortrag	29-May-2024