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Full name Familienname, Vorname
Simoen, E.
 

Own Publications Eigene Publikationen

Results 1-7 of 7 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Kaczer, B. ; Grasser, T. ; Franco, J. ; Toledano-Luque, M. ; Roussel, J. ; Cho, M. ; Simoen, E. ; Groeseneken, G. Recent Trends in Bias Temperature InstabilityBuchbeitrag Book Contribution2015
2Toledano-Luque, M. ; Kaczer, Ben ; Simoen, E. ; Degraeve, R. ; Franco, J. ; Roussel, Ph. J. ; Grasser, Tibor ; Groeseneken, G. Correlation of Single Trapping and Detrapping Effects in Drain and Gate Currents of Nanoscaled nFETs and pFETsKonferenzbeitrag Inproceedings2012
3Toledano-Luque, M. ; Kaczer, B. ; Simoen, E. ; Roussel, Ph. J. ; Veloso, A. ; Grasser, T. ; Groeseneken, G. Temperature and Voltage Dependences of the Capture and Emission Times of Individual Traps in High-k DielectricsArtikel Article2011
4Kaczer, Ben ; Grasser, Tibor ; Franco, J. ; Toledano-Luque, M. ; Roussel, Ph. J. ; Cho, M. ; Simoen, E. ; Groeseneken, G. Recent Trends in Bias Temperature InstabilityArtikel Article2011
5Kaczer, Ben ; Toledano-Luque, M. ; Franco, J. ; Grasser, Tibor ; Roussel, Ph. J. ; Camargo, V. V. A. ; Mahato, S. ; Simoen, E. ; Catthoor, F. ; Wirth, G.I. ; Groeseneken, G. Recent Trends in CMOS Reliability: From Individual Traps to Circuit SimulationsKonferenzbeitrag Inproceedings2011
6Kaczer, Ben ; Grasser, Tibor ; Roussel, Ph. J. ; Franco, J. ; Degraeve, R. ; Ragnarsson, L. A. ; Simoen, E. ; Groeseneken, G. ; Reisinger, H. Origin of NBTI Variability in Deeply Scaled pFETsKonferenzbeitrag Inproceedings2010
7Kaczer, Ben ; Grasser, Tibor ; Martin-Martinez, J. ; Simoen, E. ; Aoulaiche, M. ; Roussel, Ph. J. ; Groeseneken, G. NBTI from the Perspective of Defect States with Widely Distributed Time ScalesKonferenzbeitrag Inproceedings2009

Contributing Publications Mitbeteiligte Publikationen

Results 1-3 of 3 (Search time: 0.002 seconds).

PreviewAuthors / EditorsTitleTypeIssue Date
1Jagannathan, H. ; Martino, J. ; Karim, Z. ; Kakushima, K. ; Timans, P.J. ; Gousev, E. ; De Gendt, S. ; Misra, D. ; Obeng, Y. ; Roozeboom, F. ; Nguyen, B. ; Raskin, J. ; Gamiz, F. ; Selberherr, Siegfried ; Simoen, E. ; Ishii, H. Silicon Compatible Emerging Materials, Processes, and Technologies for Advanced CMOS and Post-CMOS Applications 13 & Advanced CMOS-Compatible Semiconductor Devices 20Proceedings Tagungsband 28-May-2023
2Martino, J. A. ; Nguyen, B.-Y. ; Gamiz, Francisco ; Ishii, H. ; Raskin, J.-P. ; Selberherr, Siegfried ; Simoen, E. Advanced CMOS-Compatible Semiconductor Devices 19Buch Book 2020
3Fiorentini, Simone ; Lacerda de Orio, Roberto ; Selberherr, Siegfried ; Ender, Johannes ; Goes, Wolfgang ; Sverdlov, Viktor Influence of Current Redistribution in Switching Models for Perpendicular STT-MRAMBuchbeitrag Book Contribution 2020