Full name Familienname, Vorname
Baer, Eberhard
 

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PreviewAuthor(s)TitleTypeIssue Date
1Lorenz, J. ; Asenov, A ; Baer, Eberhard ; Barraud, Sylvain ; Millar, C. ; Nedjalkov, Mihail Process Variability for Devices at and Beyond the 7nm NodeBuchbeitrag Book Contribution 2018
2Baer, Eberhard ; Evanschitzky, P. ; Lorenz, J. ; Roger, Frederic ; Minixhofer, R. ; Filipovic, Lado ; Orio, Roberto ; Selberherr, Siegfried Coupled Simulation to Determine Across Wafer Variations for Electrical and Reliability Parameters of Through-Silicon VIAsKonferenzbeitrag Inproceedings 2014