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Powell, C.J.
 

Own Publications Eigene Publikationen

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PreviewAuthor(s)TitleTypeIssue Date
1Hronek, Martin ; Kalbe, Henryk ; Pseiner, Johannes ; Powell, C.J. ; Werner, Wolfgang S.M. Modelling entire XPS spectra of core-shell nanoparticles (CSNP)Präsentation Presentation2017
2Hronek, Martin ; Kalbe, Henryk ; Pseiner, Johannes ; Powell, C.J. ; Werner, Wolfgang S.M. Modelling entire XPS spectra of core-shell nanoparticles (CSNP)Präsentation Presentation2017
3Tasneem, Ghazala ; Werner, Wolfgang S.M. ; Smekal, Werner ; Powell, C.J. Interlaboratory study comparing analyses of simulated angle-resolved X-ray photoelectron spectroscopy dataArtikel Article2014
4Werner, Wolfgang S.M. ; Chudzicki, Maksymilian ; Smekal, Werner ; Powell, C.J. Interpretation of nanoparticle X-ray photoelectron intensitiesArtikel Article 2014
5Chudzicki, Maksymilian ; Werner, Wolfgang S.M. ; Smekal, Werner ; Powell, C.J. Definition of arbitrary surface nanomorphologies in SESSAPräsentation Presentation2013
6Tasneem, Ghazala ; Werner, Wolfgang S.M. ; Smekal, Werner ; Powell, C.J. Simulation of parallel angle-resolved X-ray photoelectron spectroscopy dataArtikel Article2010
7Tasneem, Ghazala ; Tomastik, Christian ; Gerhold, Stefan ; Werner, Wolfgang S.M. ; Smekal, Werner ; Powell, C.J. Photoelectron angular distributions of Cu, Ag, Pt and Au samples: experiments and simulationsArtikel Article2010
8Powell, C.J. ; Werner, Wolfgang S.M. ; Smekal, Werner Distinguishability of N Composition Profiles In SiON Films On Si By Angle-Resolved X-ray Photoelectron SpectroscopyKonferenzbeitrag Inproceedings2007
9Werner, Wolfgang S.M. ; Tomastik, Christian ; Smekal, Werner ; Moon, D.W. ; Kim, K.J. ; Powell, C.J. Film thickness determination of ultra thin HfO₂ dielectrics with angle resolved XPS: Experimental electron scattering dataPräsentation Presentation2006
10Werner, Wolfgang S.M. ; Smekal, Werner ; Powell, C.J. NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA)Präsentation Presentation2006
11Werner, Wolfgang S.M. ; Powell, C.J. ; Jablonski, A. ; Smekal, Werner NIST databases with parameters describing electron transport in solidsPräsentation Presentation2006
12Powell, C.J. ; Werner, Wolfgang S.M. ; Smekal, Werner Refined calculations of effective attenuation lengths for SiO₂ film thicknesses by x-ray photoelectron spectroscopyArtikel Article2006
13Powell, C.J. ; Werner, Wolfgang S.M. ; Smekal, Werner Distinguishability of N composition profiles in SiON films on Si by angle-resolved x-ray photoelectron spectroscopyArtikel Article2006
14Werner, Wolfgang S.M. ; Smekal, Werner ; Powell, C.J. Simulation of Electron Spectra for Surface Analysis (SESSA)Präsentation Presentation2005
15Werner, Wolfgang S.M. ; Smekal, Werner ; Powell, C.J. Measurement of Thicknesses of HfO₂, HfSiO₄, ZrO₂, and ZrSiO₄ Films on Silicon by Angle-Resolved XPSPräsentation Presentation2005
16Werner, Wolfgang S.M. ; Smekal, Werner ; Powell, C.J. Measurement of Thicknesses of HfO₂, HfSiO₄, ZrO₂, and ZrSiO₄ Films on Silicon byPräsentation Presentation2005
17Werner, Wolfgang S.M. ; Smekal, Werner ; Powell, C.J. A New NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA): Application to Angle-Resolved X-ray Photoelectron Spectroscopy of HfO₂, ZrO₂, HfSiO₄, and ZrSiO₄ Films on SiliconPräsentation Presentation2005
18Smekal, Werner ; Werner, Wolfgang S.M. ; Powell, C.J. Simulation of electron spectra for surface analysis(SESSA): a novel software tool for quantitative Auger-electron spectroscopy and X-ray photoelectronspectroscopyArtikel Article2005
19Powell, C.J. ; Smekal, Werner ; Werner, Wolfgang S.M. A new NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA): Application to Angle-Resolved Photoelectron Spectroscopy of HfO2, ZrO2, HfSiO4 and ZrSiO4 Films on SiliconKonferenzbeitrag Inproceedings2005
20Werner, Wolfgang S.M. ; Smekal, Werner ; Powell, C.J. Modeling of Electron Transport in AES and XPSPräsentation Presentation2004