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Grahsl, Julian

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3 2000 - 2024

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		Preview	Author(s)	Title	Type	Issue Date
	1		Grahsl, Julian ; Handl, Thomas ; Steininger, Andreas	Exploring the Usefulness of the Gate-level Stuck-at Fault Model for Muller C-Elements	Konferenzbeitrag Inproceedings	2008
	2		Grahsl, Julian ; Handl, Thomas ; Steininger, Andreas ; Kempf, Gerald	SAFE - A Scalable Environment for Automated Transistor Level Fault Effect Analysis	Konferenzbeitrag Inproceedings	2007
	3		Fuchs, Gottfried ; Grahsl, Julian ; Schmid, Ulrich ; Steininger, Andreas ; Kempf, Gerald	Threshold Modules -- Die Schlüsselelemente zur Verteilten Generierung eines Fehlertoleranten Taktes	Konferenzbeitrag Inproceedings	2006