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Full name Familienname, Vorname
Cakmakci, Mehmet
 

Own Publications Eigene Publikationen

Results 1-8 of 8 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Cakmakci, Mehmet ; Durakbasa, M. Numan ; Karasu, Mahmut Kemal ; Bas, Gökcen ; Gurel, Umut The importance of quality control within the relationship between the quality engineering and Taguchi methodologyArtikel Article2015
2Cakmakci, Mehmet ; Durakbasa, M. Numan ; Karasu, M. Kemal ; Bas, Gökcen The relationship between the quality engineering and Taguchi methodologyKonferenzbeitrag Inproceedings 2013
3Durakbasa, M. Numan ; Osanna, Peter Herbert ; Bas, Gökcen ; Demircioglu, Pinar ; Cakmakci, Mehmet ; Hornikova, Adriana Novel Developments in Dimensional Nanometrology in the Context of Geometrical Product Specifications and Verification (GPS)Artikel Article2012
4Cakmakci, Mehmet ; Ortabas-Demirel, Neslihan ; Durakbasa, M. Numan ; Bas, Gökcen ; Hornikova, Adriana Interaction Between Capability Indices and Skewness of Non-Normal Processes Using Quantile Based Estimation and Johnson TransformationArtikel Article2012
5Cakmakci, Mehmet ; Ortabas-Demirel, Neslihan ; Durakbasa, M. Numan ; Bas, Gökcen ; Hornikova, Adriana Interaction Between Capability Indices and Skewness of Non-Normal Processes Using Quantile Based Estimation and Johnson TransformationKonferenzbeitrag Inproceedings2012
6Erol, Mustafa ; Yurddaskal, Metin ; Yildirim, Serdar ; Mermer, Omer ; Bas, Gökcen ; Cakmakci, Mehmet ; Durakbasa, M. Numan ; Celik, Erdal Nanometric measurement of the pre nano scale tio2 powders via flame spray pyrolysis: synthesis, properties and photocatalytical decomposition of methylen blueKonferenzbeitrag Inproceedings2012
7Durakbasa, M. Numan ; Osanna, Peter Herbert ; Hornikova, Adriana ; Cakmakci, Mehmet ; Bas, Gökcen ; Demircioglu, Pinar Production Engineering On The Basis Of Precision Metrology And Intelligent TolerancingKonferenzbeitrag Inproceedings2011
8Durakbasa, M. Numan ; Demircioglu, Pinar ; Cakmakci, Mehmet ; Hornikova, Adriana Nanometrology, Evaluation Techniques and Quality Control for High Accuracy Surface MeasurementKonferenzbeitrag Inproceedings2010