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Full name Familienname, Vorname
Stecher, Matthias
 

Own Publications Eigene Publikationen

Results 1-20 of 32 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Pfost, M ; Costachescu, D ; Podgaynaya, Alevtina ; Stecher, Matthias ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich Small embedded sensors for accurate temperature measurements in DMOS power transistorsKonferenzbeitrag Inproceedings2010
2Podgaynaya, Alevtina ; Rudolf, R ; Elattari, B ; Pogany, Dionyz ; Gornik, Erich ; Stecher, Matthias Single pulse energy capability and failure modes of n- and p- channel LDMOS with thick copper metallizationPräsentation Presentation2010
3Mamanee, Wasinee ; Johnsson, David ; Bychikhin, Sergey ; Stecher, Matthias ; Esmark, Kai ; Gossner, Harald ; Gornik, Erich ; Rodin, Pavel ; Pogany, Dionyz Pulse risetime effect on current filamentary modes and interaction of current filaments in ESD protection devicesPräsentation Presentation2010
4Podgaynaya, Alevtina ; Rudolf, R ; Pogany, Dionyz ; Gornik, Erich ; Stecher, Matthias Experimental and Theoretical Analysis of the Electrical SOA of Rugged p-Channel LDMOSArtikel Article2010
5Podgaynaya, Alevtina ; Pogany, Dionyz ; Gornik, Erich ; Stecher, Matthias Enhancement of the Electrical Safe Operating Area of Integrated DMOS Transistors With Respect to High-Engergy Short Duration PulsesArtikel Article2010
6Johnsson, David ; Pogany, Dionyz ; Willemen, Joost ; Gornik, Erich ; Stecher, Matthias Avalanche Breakdown Delay in ESD Protection DiodesArtikel Article2010
7Podgaynaya, Alevtina ; Rudolf, R ; Elattari, B ; Pogany, Dionyz ; Gornik, Erich ; Stecher, Matthias ; Strasser, Gottfried Single pulse energy capability and failure modes of n- and p-channel LDMOS with thick copper metallizationArtikel Article2010
8Pogany, Dionyz ; Johnsson, David ; Bychikhin, Sergey ; Esmark, Kai ; Rodin, Pavel ; Gornik, Erich ; Stecher, Matthias ; Gossner, Harald Nonlinear dynamics approach in modeling of the on-state-spreading - related voltage and current transients in 90nm CMOS silicon controlled rectifiersKonferenzbeitrag Inproceedings2009
9Pogany, Dionyz ; Bychikhin, Sergey ; Mamanee, Wasinee ; Gornik, Erich ; Johnsson, David ; Esmark, Kai ; Gossner, Harald ; Stecher, Matthias ; Rodin, Pavel Interacting traveling current filaments and spreading fronts in sandwiched semiconductor nanostructuresKonferenzbeitrag Inproceedings2009
10Haberfehlner, Georg ; Bychikhin, Sergey ; Dubec, Victor ; Heer, Michael ; Podgaynaya, A ; Pfost, M ; Stecher, Matthias ; Gornik, Erich ; Pogany, Dionyz Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping systemPräsentation Presentation2009
11Pogany, Dionyz ; Bychikhin, Sergey ; Esmark, Kai ; Rodin, Pavel ; Johnsson, David ; Stecher, Matthias ; Gornik, Erich ; Gossner, Harald Modeling of on-state width spreading and voltage transients in 90nm CMOS SCRPräsentation Presentation2009
12Podgaynaya, Alevtina ; Pogany, Dionyz ; Gornik, Erich ; Stecher, Matthias Investigation and improvement of the electrical Safe Operating Area of DMOS transistor during ESD EventsKonferenzbeitrag Inproceedings2009
13Mamanee, Wasinee ; Bychikhin, Sergey ; Johnsson, David ; Jensen, Nils ; Stecher, Matthias ; Gornik, Erich ; Pogany, Dionyz Effect of Chip Heating on Thermal Breakdown Occurrence in SPT ESD Protection Devices Subjected to 0.5-1µs Long Current PulsesPräsentation Presentation2009
14Pogany, Dionyz ; Bychikhin, Sergey ; Johnsson, David ; Esmark, Kai ; Rodin, Pavel ; Stecher, Matthias ; Gornik, Erich ; Gossner, Harald Assessing "2D" holding point in ESD protection structures exhibiting 3D behavior using multi-level TLP analysisPräsentation Presentation2009
15Pogany, Dionyz ; Bychikhin, Sergey ; Heer, Michael ; Mamanee, Wasinee ; Dubec, Victor ; Gornik, Erich ; Johnsson, David ; Domanski, Krzysztof ; Esmark, Kai ; Stadler, Wolfgang ; Gossner, Harald ; Stecher, Matthias Application of transient interferometric mapping (TIM) technique for analysis of ns time scale thermal and free carrier dynamics in ESD protection devicesPräsentation Presentation2009
16Johnsson, David ; Mayerhofer, Michael ; Willemen, Joost ; Glaser, Ulrich ; Pogany, Dionyz ; Gornik, Erich ; Stecher, Matthias Avalanche Breakdown Delay in High-Voltage p-n Junctions Caused by Pre-Pulse Voltage From IEC 61000-4-2 ESD GeneratorsArtikel Article2009
17Haberfehlner, Georg ; Bychikhin, Sergey ; Dubec, Victor ; Heer, Michael ; Podgaynaya, A ; Stecher, Matthias ; Gornik, Erich ; Pogany, Dionyz Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping systemArtikel Article2009
18Mamanee, Wasinee ; Johnsson, David ; Rodin, Pavel ; Bychikhin, Sergey ; Dubec, Victor ; Stecher, Matthias ; Gornik, Erich ; Pogany, Dionyz Interaction of traveling current filaments and its relation to a nontrivial thermal breakdown scenario in avalanching bipolar transistorArtikel Article2009
19Johnsson, David ; Mamanee, Wasinee ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Stecher, Matthias Second breakdown in bipolar ESD protection devices during low current long duration stress and its relation to moving current-tubesKonferenzbeitrag Inproceedings2008
20Rudan, Massimo ; Reggiani, Susanna ; Gnani, Elena ; Baccarani, Giorgio ; Corvasce, Ciara ; Ciappa, Mauro ; Stecher, Matthias ; Pogany, Dionyz ; Gornik, Erich Physical Models for Smart-Power DevicesKonferenzbeitrag Inproceedings2006