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| | Preview | Author(s) | Title | Type | Issue Date |
| 1 | | Mamanee, Wasinee ; Bychikhin, Sergey ; Johnsson, David ; Jensen, Nils ; Stecher, Matthias ; Gornik, Erich ; Pogany, Dionyz | Effect of Chip Heating on Thermal Breakdown Occurrence in SPT ESD Protection Devices Subjected to 0.5-1µs Long Current Pulses | Präsentation Presentation | 2009 |
| 2 | | Reggiani, Susanna ; Gnani, Elena ; Rudan, Massimo ; Baccarani, Giorgio ; Bychikhin, Sergey ; Kuzmik, Jan ; Pogany, Dionyz ; Gornik, Erich ; Denison, Marie ; Jensen, Nils ; Groos, Gerhard ; Stecher, Matthias | Experimental investigation on carrier dynamics at the thermal breakdown | Konferenzbeitrag Inproceedings  | 2006 |
| 3 | | Reggiani, Susanna ; Gnani, Elena ; Rudan, Massimo ; Baccarani, Giorgio ; Bychikhin, Sergey ; Kuzmik, Jan ; Pogany, Dionyz ; Gornik, Erich ; Denison, Marie ; Jensen, Nils ; Groos, Gerhard ; Stecher, Matthias | Predictive device simulation for ESD protection structures validated with transient interferometric thermal-mapping experiments | Konferenzbeitrag Inproceedings | 2005 |
| 4 | | Pogany, Dionyz ; Bychikhin, Sergey ; Kuzmik, Jan ; Gornik, Erich ; Denison, Marie ; Jensen, Nils ; Stecher, Matthias ; Rodin, Pavel ; Groos, Gerhard | Observation of travelling current filaments in semiconductor devices using transient interferometric mapping | Konferenzbeitrag Inproceedings | 2005 |
| 5 | | Reggiani, Susanna ; Gnani, Elena ; Rudan, Massimo ; Baccarani, Giorgio ; Bychikhin, Sergey ; Kuzmik, Jan ; Pogany, Dionyz ; Gornik, Erich ; Denison, Marie ; Jensen, Nils ; Groos, Gerhard ; Stecher, Matthias | A New Numerical and Experimental Analysis Tool for ESD Devices by Means of the Transient Interferometric Technique | Artikel Article | 2005 |
| 6 | | Dubec, Victor ; Bychikhin, Sergey ; Blaho, M. ; Heer, Michael ; Pogany, Dionyz ; Gornik, Erich ; Denison, Marie ; Jensen, Nils ; Stecher, Matthias ; Groos, Gerhard | Multiple-time-instant 2D thermal mapping during a single ESD event | Präsentation Presentation | 2004 |
| 7 | | Pogany, Dionyz ; Bychikhin, Sergey ; Kuzmik, Jan ; Dubec, Victor ; Jensen, Nils ; Denison, Marie ; Groos, Gerhard ; Stecher, Matthias ; Gornik, Erich | Thermal Distribution During Destructive Pulses in ESD Protection Devices Using a Single-Shot Two-Dimensional Interferometric Method | Artikel Article | 2003 |
| 8 | | Denison, Marie ; Blaho, M. ; Silber, D ; Joos, J ; Jensen, Nils ; Stecher, Matthias ; Dubec, Victor ; Pogany, Dionyz ; Gornik, Erich | Hot spot dynamics in quasi vertical DMOS under ESD stress | Konferenzbeitrag Inproceedings | 2003 |