Name Card

Full name Familienname, Vorname
Stadler, Wolfgang
 

Own Publications Eigene Publikationen

Results 1-7 of 7 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Pogany, Dionyz ; Bychikhin, Sergey ; Heer, Michael ; Mamanee, Wasinee ; Dubec, Victor ; Gornik, Erich ; Johnsson, David ; Domanski, Krzysztof ; Esmark, Kai ; Stadler, Wolfgang ; Gossner, Harald ; Stecher, Matthias Application of transient interferometric mapping (TIM) technique for analysis of ns time scale thermal and free carrier dynamics in ESD protection devicesPräsentation Presentation2009
2Heer, Michael ; Domanski, Krzysztof ; Esmark, Kai ; Glaser, Ulrich ; Pogany, Dionyz ; Gornik, Erich ; Stadler, Wolfgang Transient interferometric mapping of carrier plasma during external transient latch-up phenomenian latch-up test structures and I /O cells processed in CMOS technologyArtikel Article2009
3Dubec, Victor ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Brodbeck, T ; Stadler, Wolfgang Backside Interferometric Methods for Localization of ESD-Induced Leakage Current and Metal ShortsArtikel Article2007
4Dubec, Victor ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ; Brodbeck, T ; Stadler, Wolfgang Backside Interferometric Methods for Localization of ESD-Induced Leakage Current and Metal ShortsPräsentation Presentation2007
5Domanski, Krzysztof ; Heer, Michael ; Esmark, Kai ; Pogany, Dionyz ; Stadler, Wolfgang ; Gornik, Erich External (transient) latchup phenomenon investigated by optical mapping (TIM) techniqueKonferenzbeitrag Inproceedings2007
6Stadler, Wolfgang ; Esmark, Kai ; Reynders, K ; Zubeidat, M ; Graf, M. ; Wilkening, W ; Willemen, Joost ; Qu, N ; Mettler, S ; Etherton, M ; Nuernbergk, D ; Wolf, H ; Gieser, H. ; Soppa, W. ; Heyn, V.De ; Natarajan, M ; Groeseneken, G. ; Morena, E ; Stella, R ; Andreini, A. ; Litzenberger, Martin ; Pogany, Dionyz ; Gornik, Erich ; Foss, C ; Konrad, A ; Frank, M Test Circuits for Fast and Reliable Assessment of CDM Robustness of I/O stagesArtikel Article 2005
7Stadler, Wolfgang ; Esmark, Kai ; Gossner, Harald ; Streibl, M. ; Wendel, M. ; Fichtner, W. ; Litzenberger, Martin ; Pogany, Dionyz ; Gornik, Erich Device Simulation and Backside Laser Interferometry - Powerful Tools for ESD Protection DevelopmentPräsentation Presentation2002