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Full name Familienname, Vorname
Esmark, Kai
 

Own Publications Eigene Publikationen

Results 1-15 of 15 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Mamanee, Wasinee ; Johnsson, David ; Bychikhin, Sergey ; Stecher, Matthias ; Esmark, Kai ; Gossner, Harald ; Gornik, Erich ; Rodin, Pavel ; Pogany, Dionyz Pulse risetime effect on current filamentary modes and interaction of current filaments in ESD protection devicesPräsentation Presentation2010
2Pogany, Dionyz ; Johnsson, David ; Bychikhin, Sergey ; Esmark, Kai ; Rodin, Pavel ; Gornik, Erich ; Stecher, Matthias ; Gossner, Harald Nonlinear dynamics approach in modeling of the on-state-spreading - related voltage and current transients in 90nm CMOS silicon controlled rectifiersKonferenzbeitrag Inproceedings2009
3Pogany, Dionyz ; Bychikhin, Sergey ; Mamanee, Wasinee ; Gornik, Erich ; Johnsson, David ; Esmark, Kai ; Gossner, Harald ; Stecher, Matthias ; Rodin, Pavel Interacting traveling current filaments and spreading fronts in sandwiched semiconductor nanostructuresKonferenzbeitrag Inproceedings2009
4Pogany, Dionyz ; Bychikhin, Sergey ; Esmark, Kai ; Rodin, Pavel ; Johnsson, David ; Stecher, Matthias ; Gornik, Erich ; Gossner, Harald Modeling of on-state width spreading and voltage transients in 90nm CMOS SCRPräsentation Presentation2009
5Pogany, Dionyz ; Bychikhin, Sergey ; Johnsson, David ; Esmark, Kai ; Rodin, Pavel ; Stecher, Matthias ; Gornik, Erich ; Gossner, Harald Assessing "2D" holding point in ESD protection structures exhibiting 3D behavior using multi-level TLP analysisPräsentation Presentation2009
6Pogany, Dionyz ; Bychikhin, Sergey ; Heer, Michael ; Mamanee, Wasinee ; Dubec, Victor ; Gornik, Erich ; Johnsson, David ; Domanski, Krzysztof ; Esmark, Kai ; Stadler, Wolfgang ; Gossner, Harald ; Stecher, Matthias Application of transient interferometric mapping (TIM) technique for analysis of ns time scale thermal and free carrier dynamics in ESD protection devicesPräsentation Presentation2009
7Heer, Michael ; Domanski, Krzysztof ; Esmark, Kai ; Glaser, Ulrich ; Pogany, Dionyz ; Gornik, Erich ; Stadler, Wolfgang Transient interferometric mapping of carrier plasma during external transient latch-up phenomenian latch-up test structures and I /O cells processed in CMOS technologyArtikel Article2009
8Esmark, Kai ; Gossner, Harald ; Bychikhin, Sergey ; Pogany, Dionyz ; Russ, C ; Langguth, G. ; Gornik, Erich Transient behaviour of SCRs under ESD pulsesKonferenzbeitrag Inproceedings2008
9Domanski, Krzysztof ; Heer, Michael ; Esmark, Kai ; Pogany, Dionyz ; Stadler, Wolfgang ; Gornik, Erich External (transient) latchup phenomenon investigated by optical mapping (TIM) techniqueKonferenzbeitrag Inproceedings2007
10Stadler, Wolfgang ; Esmark, Kai ; Reynders, K ; Zubeidat, M ; Graf, M. ; Wilkening, W ; Willemen, Joost ; Qu, N ; Mettler, S ; Etherton, M ; Nuernbergk, D ; Wolf, H ; Gieser, H. ; Soppa, W. ; Heyn, V.De ; Natarajan, M ; Groeseneken, G. ; Morena, E ; Stella, R ; Andreini, A. ; Litzenberger, Martin ; Pogany, Dionyz ; Gornik, Erich ; Foss, C ; Konrad, A ; Frank, M Test Circuits for Fast and Reliable Assessment of CDM Robustness of I/O stagesArtikel Article 2005
11Stadler, Wolfgang ; Esmark, Kai ; Gossner, Harald ; Streibl, M. ; Wendel, M. ; Fichtner, W. ; Litzenberger, Martin ; Pogany, Dionyz ; Gornik, Erich Device Simulation and Backside Laser Interferometry - Powerful Tools for ESD Protection DevelopmentPräsentation Presentation2002
12Litzenberger, Martin ; Pichler, R. ; Bychikhin, Sergey ; Pogany, Dionyz ; Esmark, Kai ; Gossner, Harald ; Gornik, Erich Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection structuresPräsentation Presentation2001
13Fürböck, Christoph ; Esmark, Kai ; Litzenberger, Martin ; Pogany, Dionyz ; Groos, Gerhard ; Zelsacher, R. ; Stecher, Matthias ; Gornik, Erich Thermal and free carrier concentration mapping during ESD event in Smart Power ESD protection devices using a modified laser interferometry techniquePräsentation Presentation2000
14Pogany, Dionyz ; Esmark, Kai ; Litzenberger, Martin ; Fürböck, Christoph ; Gossner, Harald ; Gornik, Erich Bulk and surface degradation mode in 0.35um technology gg-nMOS ESD protection devicesPräsentation Presentation2000
15Litzenberger, Martin ; Esmark, Kai ; Pogany, Dionyz ; Fürböck, Christoph ; Gossner, Harald ; Gornik, Erich ; Fichtner, W. Study of tiggering inhomogeneities in gg-nMOS ESD protection devices via thermal mapping using bachside laser interferometryPräsentation Presentation2000