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Schlünder, C.
 

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Results 1-9 of 9 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Puschkarsky, Katja ; Reisinger, H. ; Schlünder, C. ; Gustin, W. ; Grasser, Tibor Fast Acquisition of Activation Energy Maps Using Temperature Ramps for Lifetime Modeling of BTIKonferenzbeitrag Inproceedings 2018
2Rott, K. ; Reisinger, H. ; Aresu, S. ; Schlünder, C. ; Kölpin, K. ; Gustin, W. ; Grasser, T. New Insights on the PBTI Phenomena in SiON pMOSFETsArtikel Article2012
3Reisinger, H. ; Grasser, Tibor ; Ermisch, K. ; Nielen, H. ; Gustin, W. ; Schlünder, C. Understanding and Modeling AC BTIKonferenzbeitrag Inproceedings2011
4Schlünder, C. ; Reisinger, H. ; Gustin, W. ; Grasser, Tibor A New Physics-Based NBTI Model for DC-and AC-Stress Enabling Accurate Circuit Aging Simulations Considering RecoveryKonferenzbeitrag Inproceedings2010
5Reisinger, H. ; Grasser, Tibor ; Hofmann, K. ; Gustin, W. ; Schlünder, C. The impact of recovery on BTI reliability assessmentsKonferenzbeitrag Inproceedings2010
6Reisinger, H. ; Grasser, Tibor ; Schlünder, C. A Study of NBTI by the Statistical Analysis of the Properties of Individual Defects in pMOSFETSKonferenzbeitrag Inproceedings2009
7Reisinger, H. ; Vollertsen, R. P. ; Wagner, Paul-Jürgen ; Huttner, T. ; Martin, A. ; Aresu, S. ; Gustin, W. ; Grasser, Tibor ; Schlünder, C. A Study of NBTI and Short-Term Threshold Hysteresis of Thin Nitrided and Thick Non-Nitrided OxidesArtikel Article 2009
8Reisinger, H. ; Vollertsen, R. P. ; Wagner, Paul-Jürgen ; Huttner, T. ; Martin, A. ; Aresu, S. ; Gustin, W. ; Grasser, Tibor ; Schlünder, C. The Effect of Recovery on NBTI Characterization of Thick Non-Nitrided OxidesKonferenzbeitrag Inproceedings2008
9Grasser, Tibor ; Kaczer, Ben ; Hehenberger, Philipp Paul ; Gös, Wolfgang ; Connor, R. ; Reisinger, H. ; Gustin, W. ; Schlünder, C. Simultaneous Extraction of Recoverable and Permanent Components Contributing to Bias-Temperature InstabilityKonferenzbeitrag Inproceedings2007