Name Card

Full name Familienname, Vorname
Gossner, Harald
 

Own Publications Eigene Publikationen

Results 1-14 of 14 (Search time: 0.001 seconds).

PreviewAuthor(s)TitleTypeIssue Date
1Shrivastava, Mayank ; Russ, C ; Gossner, Harald ; Bychikhin, Sergey ; Pogany, Dionyz ; Gornik, Erich ESD Robust DeMOS Devices in Advanced CMOS TechnologiesKonferenzbeitrag Inproceedings2011
2Shrivastava, Mayank ; Bychikhin, Sergey ; Pogany, Dionyz ; Schneider, Jens ; Shojaei, M ; Gossner, Harald ; Gornik, Erich ; Ramgopal Rao, V On the differences between 3D filamentation and failure of N & P type drain extended MOS devices under ESD conditionsKonferenzbeitrag Inproceedings2010
3Mamanee, Wasinee ; Johnsson, David ; Bychikhin, Sergey ; Stecher, Matthias ; Esmark, Kai ; Gossner, Harald ; Gornik, Erich ; Rodin, Pavel ; Pogany, Dionyz Pulse risetime effect on current filamentary modes and interaction of current filaments in ESD protection devicesPräsentation Presentation2010
4Pogany, Dionyz ; Johnsson, David ; Bychikhin, Sergey ; Esmark, Kai ; Rodin, Pavel ; Gornik, Erich ; Stecher, Matthias ; Gossner, Harald Nonlinear dynamics approach in modeling of the on-state-spreading - related voltage and current transients in 90nm CMOS silicon controlled rectifiersKonferenzbeitrag Inproceedings2009
5Shrivastava, Mayank ; Bychikhin, Sergey ; Pogany, Dionyz ; Schneider, Jens ; Baghini, Shojaei ; Gossner, Harald ; Gornik, Erich ; Ramgopal Rao, V Filament study of STI type drain extended NMOS device using transient interferometric mappingKonferenzbeitrag Inproceedings2009
6Pogany, Dionyz ; Bychikhin, Sergey ; Mamanee, Wasinee ; Gornik, Erich ; Johnsson, David ; Esmark, Kai ; Gossner, Harald ; Stecher, Matthias ; Rodin, Pavel Interacting traveling current filaments and spreading fronts in sandwiched semiconductor nanostructuresKonferenzbeitrag Inproceedings2009
7Pogany, Dionyz ; Bychikhin, Sergey ; Esmark, Kai ; Rodin, Pavel ; Johnsson, David ; Stecher, Matthias ; Gornik, Erich ; Gossner, Harald Modeling of on-state width spreading and voltage transients in 90nm CMOS SCRPräsentation Presentation2009
8Pogany, Dionyz ; Bychikhin, Sergey ; Johnsson, David ; Esmark, Kai ; Rodin, Pavel ; Stecher, Matthias ; Gornik, Erich ; Gossner, Harald Assessing "2D" holding point in ESD protection structures exhibiting 3D behavior using multi-level TLP analysisPräsentation Presentation2009
9Pogany, Dionyz ; Bychikhin, Sergey ; Heer, Michael ; Mamanee, Wasinee ; Dubec, Victor ; Gornik, Erich ; Johnsson, David ; Domanski, Krzysztof ; Esmark, Kai ; Stadler, Wolfgang ; Gossner, Harald ; Stecher, Matthias Application of transient interferometric mapping (TIM) technique for analysis of ns time scale thermal and free carrier dynamics in ESD protection devicesPräsentation Presentation2009
10Esmark, Kai ; Gossner, Harald ; Bychikhin, Sergey ; Pogany, Dionyz ; Russ, C ; Langguth, G. ; Gornik, Erich Transient behaviour of SCRs under ESD pulsesKonferenzbeitrag Inproceedings2008
11Stadler, Wolfgang ; Esmark, Kai ; Gossner, Harald ; Streibl, M. ; Wendel, M. ; Fichtner, W. ; Litzenberger, Martin ; Pogany, Dionyz ; Gornik, Erich Device Simulation and Backside Laser Interferometry - Powerful Tools for ESD Protection DevelopmentPräsentation Presentation2002
12Litzenberger, Martin ; Pichler, R. ; Bychikhin, Sergey ; Pogany, Dionyz ; Esmark, Kai ; Gossner, Harald ; Gornik, Erich Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection structuresPräsentation Presentation2001
13Pogany, Dionyz ; Esmark, Kai ; Litzenberger, Martin ; Fürböck, Christoph ; Gossner, Harald ; Gornik, Erich Bulk and surface degradation mode in 0.35um technology gg-nMOS ESD protection devicesPräsentation Presentation2000
14Litzenberger, Martin ; Esmark, Kai ; Pogany, Dionyz ; Fürböck, Christoph ; Gossner, Harald ; Gornik, Erich ; Fichtner, W. Study of tiggering inhomogeneities in gg-nMOS ESD protection devices via thermal mapping using bachside laser interferometryPräsentation Presentation2000